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A 16-Bit Kogge Stone PS-CMOS adder with Signal Completion. Seng-Oon Toh, Daniel Huang, Jan Rabaey May 9, 2005 EE241 Final Project. Motivation. Asynchronous designs give better throughput and has higher efficiency
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A 16-Bit Kogge Stone PS-CMOS adder with Signal Completion Seng-Oon Toh, Daniel Huang, Jan Rabaey May 9, 2005 EE241 Final Project
Motivation • Asynchronous designs give better throughput and has higher efficiency • Larger circuits and smaller transistors is more susceptible to process variations. • Process variation decreases yield of circuits • Reach optimum clocking frequency per block • Need for self timing with the circuits with a signal completion, which also increases yield from process variations. EE241
Past Solution • GALS • DCDVSL IEEE, 1998 EE241
PS-CMOS 16-bit Kogge-Stone Pipelined Adder • Adders • Adder is an integral part of ALU • Large pipelined adders may be beneficial for large adders to increase clock frequencies and throughput EE241
PS-CMOS 16-bit Kogge Stone Pipelined Adder • Adder Design • Kogge-Stone CLA • Four stages • Stage 1: Bit P and G • Stage 2: Dot 1, 2 • Stage 3: Dot 3, 4, Cout • Stage 4: Sum • 2-Input gates, no complex logic gates, for significant logic depth. 1 2 3 4 EE241
PS-CMOS 16-bit Kogge Stone Pipelined Adder • PS-CMOS • Monotonic output transition • Noise Immunity • Pseudo-dynamic, fast evaluate EE241
PS-CMOS 16-bit Kogge Stone Pipelined Adder • Completion Signal • Simple scheme that is compatible with PS-CMOS • DCDVSL • Dummy paths • Take advantage of monotonic output transition • Input the worst case input vector upon startup to find clock frequency • Calibrate in situ EE241
Completion Signal Scheme precharge evaluate Output signal Delay Output signal Clock signal EE241
Completion Signal Scheme Slow Clock precharge evaluate Output signal Delay Output signal Clock signal EE241
Completion Signal SchemeFast Clock precharge evaluate Output signal Delay Output signal Clock signal EE241
Completion Signal Circuitry Stage 3 Input Critical path Output sum Input check 8-bit Counter Check for delay Increase, decrease, stop counting DAC Clock Generation VCO EE241
Results EE241
Results EE241
Results • Theoretical delay 714ps, measure 850ps • For in situ calibration how often will the worst case input vector appear? • Assuming perfectly random inputs • Worst case input vector will appear approximately once every 105 switches • Circuit runs approximately 109 switches per second • Every second there can be a potential of 104 updates. • This sets the optimum clock speed to clock for the calibration circuitry EE241
Results • Counter able to count up as well as down • Speed up and slow down based on conditions • Ability to calibrate for different supply voltages • Ability to test at startup and in situ EE241
Discussion • Ideal sensor has 0 capacitance • We have small capacitance • 1 inverter, 1 latch • Circuit Overhead low • Probability of Switching • Maximum clock frequency for test circuit • Calibration frequency is high • Multiple paths available for detection • Closes feedback path for DVS EE241
Discussion • During clock change no evaluation is allowed • Slack margin 100 ps built in delay from detection • Nonexistant with registers, because of intrinsic need of delay for registers • PS-CMOS • Difficult to implement XOR • Not straight forward logic • When used with latches timing of precharge and evaluate is difficult • Frequency increments • Small time step necessary for stability EE241
Future Improvements • Fix delay overhead of detection circuit • Fix problems from latch based design • Circuitry for multiple path detection • Super Pipeline 256-bit adder • Ability to run adder slower • Monitor precharge EE241
Conclusion • Shown a simple completion signal scheme for a pipelined PS-CMOS adder • Small amount of overhead • Ability to adjust clock frequencies during operation not only on startup Because I could not stop for Death,He kindly stopped for me;The carriage held but just ourselvesAnd Immortality. -Emily Dickinson, 1924 EE241