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Enhancing Refraction Data Migration Using the CRRM Method for Improved Accuracy

This presentation by Maike Buddensiek from the University of Utah explores the innovative Critical Refraction Reflection Migration (CRRM) method. It emphasizes how traditional refraction data, often laden with artifacts, can be effectively migrated akin to critical reflections. The talk outlines essential methodologies, presents results from synthetic data, and discusses the advantages of CRRM, including independence from the refracting layer's velocity and adaptability to various geometries. The findings suggest that CRRM offers more precise mapping of refractors, presenting a promising avenue for further research and application in field data.

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Enhancing Refraction Data Migration Using the CRRM Method for Improved Accuracy

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  1. Critical Wavepath Refraction Migration Maike Buddensiek, University of Utah, Feb. 2003

  2. Outline • Introduction - Why are we doing this? • Basic concept of CRRM method • Results of synthetic data • Conclusions and further research

  3. Introduction • Refraction data contain hidden information of reflection traveltimes. • After resorting the data, they are kinematical equivalent to critical reflections. • Those critical refractions can be migrated just like reflections. • Less artifacts • Velocity of refracting layer not necessary • Any refractor geometry can be migrated

  4. v1 v2 TAY TAY + TBX - TAB TAY + TBX BasicConcept A X M Y B TAY + TBX - TAB

  5. v1 v2 BasicConcept BasicConcept A X M Y B TAY TAY + TBX - TAB TAY + TBX TAY + TBX - TAB

  6. v1 v2 BasicConcept BasicConcept A X M Y B TAY TAY + TBX - TAB TAY + TBX TAY + TBX - TAB

  7. v1 v2 BasicConcept BasicConcept A X M Y B TAY TAY + TBX - TAB TAY + TBX TAY + TBX - TAB = TXY TAY + TBX - TAB

  8. Critical Distance v1 v2 BasicConcept A X M Y B O TAY + TBX - TAB = TXY TXYdata : kinematics of reflection

  9. v1 v2 O TXO + TOY = TXOYtheory Migration by Raytracing A X M Y B

  10. v1 v2 Incidence Angles for Raytracing   A X M Y B  

  11. v1   v2 O Migration by Raytracing A X M Y B TXOYtheory  TXYdata

  12. Critical Distance v1 v2 Migration by Raytracing A X M Y B O TXOYtheory = TXYdata

  13. v1 v2 A X M Y B CRRM Method • 1. Select A, B, X, Y and then trace rays • 2. Determine TXOYtheory • 3. Determine TXYdata • 4. If TXYdata = TXOYtheory • Smear refraction energy at O. • Otherwise no energy is smeared. O

  14. Dipping Layer Model 1 600 300

  15. Dipping Layer Model 2 600 300

  16. Low Frequency Undulation 600 300

  17. High Frequency Undulation 600 300

  18. Fault Model 600 300

  19. Results • Very accurate mapping of the refractors • No artifacts • The refracting velocity is not known • Problemaict zones just result in unmapped traces

  20. Conclusion • The CRRM method has the potential to migrate refraction data more precisely than traditional methods. • CRRM does not produce artifacts like traditional methods do. • Future Work: Make suggested changes and then apply to field data.

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