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LRU Test Methodologies

LRU Test Methodologies. May 16, 2006. Working Together to Meet the Most Critical System Requirements Performance for the latest designs Flexibility for legacy replacement Functional and operational test at all levels of assembly UUT-Oriented instrumentation software. The LRU Test Problem.

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LRU Test Methodologies

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  1. LRU Test Methodologies May 16, 2006

  2. Working Together to Meet the Most Critical System Requirements • Performance for the latest designs • Flexibility for legacy replacement • Functional and operational test at all levels of assembly • UUT-Oriented instrumentation software

  3. The LRU Test Problem Parallel Digital Parallel Digital Serial Bus Digital Analog

  4. LRU Test Requirements • Parallel Digital Test • Bus-Oriented LRU Ports • Random I/O Ports • Serial Digital Test • Standard Serial Busses • Custom or Variations of Standard Busses • Analog Test • Traditional Sequential Testing • Parallel Operation • Concurrent Monitoring

  5. Di-050 Parallel Performance Digital Ai-760 High-Density Instrument Replacement Analog Bi-Series High-Speed Serial Digital Tru-Sync Software: Instrument/UUT Synchronization The Core System Instrumentation Roadmap M9-Series Digital Ai-710 Analog Bi-410 Bus

  6. Di-050 Parallel Performance Digital Ai-760 High-Density Instrument Replacement Analog Bi-Series High-Speed Serial Digital The Core System Instrumentation Roadmap M9-Series Digital Ai-710 Analog Bi-410 Bus

  7. Di-Series: Adding Flexibility, Performance, and Usability in an M9-Compatible Solution

  8. Flexible Di-Series Pin Electronics Address Legacy and Performance Requirements 30V Swings for Legacy UUTs 300 mV Swings for LVDS 1ns transitions for LVDS in carefully-controlled transmission environment Slow transitions for poorly-controlled transmission environment of legacy test adapters Levels, Edge Speed, and Timing Programmed on a Per-Channel Basis

  9. Di-Series Handshake Engine Simplifies Asynchronous Transfers Asynchronous Write Cycle from Instrument to UUT Signals from instrument to UUT Handshake Signal from UUT Asynchronous delay Instrument indicates data is available UUT indicates it is ready to receive data

  10. The Di-Series Has No Central Resources and is Configurable in Software VXI Card Cage • No Central Resource Board • Software configurable as one or many Virtual Instruments • Each Virtual Instrument operates independently

  11. The Di-Series Has No Central Resources and is Configurable in Software Virtual Instrument 1 Virtual Instrument 2 Virtual Instrument 3

  12. LRU-Centric Flexibility: Asynchronous Test and Bus Emulation 33 MHz 10 MHz Virtual Instrument 2 Virtual Instrument 1 25 MHz • Concurrent, independent, asynchronous emulation & test • Each instrument emulates an LRU bus or surrounding signals • LRU capabilities greatly enhance SRU-test Virtual Instrument 3

  13. CSi iStudio Development and Debugging Software • iStudio is a way to: • Interactively learn to use the instrument • Create pattern sets • Import test vectors from external sources • Debug all tests independent of development methodology • Create tests to run from your current environment // Pattern: 4 patternBlock.IL(IOM, ADLTCHIN); patternBlock.IG(AddressBus, 0x20ff); patternBlock.IH(RDL, WRL); patternBlock.OH(RESETOUT); patternModifier.TraceOn(); patternBlock.EndPattern(TestInstruction.PassFail);

  14. Di-050 Parallel Performance Digital Ai-760 High-Density Instrument Replacement Analog Bi-Series High-Speed Serial Digital The Core System Instrumentation Roadmap M9-Series Digital Ai-710 Analog Bi-410 Bus

  15. Ai-760 DMM VXI Scope ARB Digitizer T/C X8 CSi Product RoadmapAi-760 - High-density Analog Instrument • Targets replacement of conventional instrumentation • Maintains Ai-710 parallel test capability for true operational test • Dramatically reduces VXI slot requirements

  16. Digitizer DMM DSO Ai-760 Block DiagramSingle-Ended Multi-Function Analog Channels 8 Channels single-ended source single-ended measure Triggering System Arb/ FGEN Arb Source Channel I/O Measure Timer Counter  8

  17. Digitizer Source DMM 2-channel scope Measure Ai-760 Block DiagramDifferential Multi-Function Analog Channels 4 Channels differential source differential measure Triggering System Arb/ FGEN Arb Source Channel I/O Measure Timer Counter  4

  18. iStudio for Ai-760 • Interactive Execution and Control • DMM • Scope • Function Generator • Standard • Arbitrary • Counter • Digitizer • Code Generation • Triggering and Synchronization • Built-in analysis

  19. Parallel Digital Parallel Digital Traditional Sequential Analog Serial Bus Digital Parallel Multi-function Analog (MFA) Mixed Signal LRU Test With Multiple Concurrent Digital and Analog Instrumentation

  20. Low-Level Synchronization Interface Using Standard Instrument Drivers • Synchronization hardware is very capable, but complex • User must understand all hardware details • Each driver is an island without knowledge of other instruments TPS Code Instrument Driver Instrument Driver Instrument Driver Instrument Driver Sync Hardware Unit Under Test

  21. T T T T iStudio Sync Editor Provides Graphical Setup and Debug of the Tru-Sync Driver Graphical Synchronization Editor Tru-Sync Driver Instrument Driver Instrument Driver Instrument Driver Instrument Driver Unit Under Test

  22. Conclusion • LRU (box) test requires a greater level of asynchronous and concurrent activity than SRU (board) test • The Teradyne CSi Family of hardware and software directly addresses LRU test requirements today • The CSi Roadmap paves the way for the LRU testing of the future

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