'Chip area' diaporamas de présentation

Physical Design Automation Placement and Routing

Physical Design Automation Placement and Routing. Speaker: Devjyoti Patra. Problem formulation (Placement). Input: Blocks (standard cells and macros) B 1 , ... , B n Shapes and Pin Positions for each block B i Nets N 1 , ... , N m Output:

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Workshop for Electron Beam Lithography System JBX-6300FS By Nelson LI 13 November 2009

Nanoelectronics Fabrication Facility . Workshop for Electron Beam Lithography System JBX-6300FS By Nelson LI 13 November 2009. Page 1. System specifications Importance of chip feature on writing result Requirements of overlay writing Photoresist provide Requirements of pattern design

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Lecture 2

Lecture 2. Microprocessor Architecture. Image from : http :// micro . magnet . fsu . edu / chipshots / intel / images / intel8080dielarge . jpg. Agenda. Microprocessor components The memory Internal organization of MPU Introducing MARIE Source Homework. Von Neumann Model (Revisited).

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Lecture 27 Memory and Delay-Fault Built-In Self-Testing

Lecture 27 Memory and Delay-Fault Built-In Self-Testing. Definitions Static RAM March Test BIST SRAM BIST with a MISR Neighborhood Pattern Sensitive Fault (NPSF) DRAM BIST Transparent testing Complex examples Delay fault BIST Summary. Definitions.

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Lecture 27 Memory and Delay-Fault Built-In Self-Testing

Lecture 27 Memory and Delay-Fault Built-In Self-Testing. Definitions Static RAM March Test BIST SRAM BIST with a MISR Neighborhood Pattern Sensitive Fault (NPSF) DRAM BIST Transparent testing Complex examples Delay fault BIST Summary. Definitions.

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FPGA and CADs

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CSCE 932, Spring 2007

CSCE 932, Spring 2007. Yield Analysis and Product Quality. Yield Analysis & Product Quality. Yield, defect level, and manufacturing cost Clustered defects and yield model Test data analysis Example: SEMATECH chip Summary. ALL CHIPS. Test. (Tester Yield). FAIL. PASS. Bad. Good.

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Exploring the Design Space of Future CMPs

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Exploring the Design Space of Future CMPs

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VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 24, 2012, 4:00-5:00PM. Contents.

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VLSI Testing Lecture 2: Yield & Quality

VLSI Testing Lecture 2: Yield & Quality. Yield and manufacturing cost Clustered defect yield formula Defect level Test data analysis Example: SEMATECH chip Summary Problems to solve. VLSI Chip Yield.

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Design and Implementation of VLSI Systems (EN0160) Lecture 16: Scaling Theory

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Lecture 1 Introduction

Lecture 1 Introduction. VLSI realization process Verification and test Ideal and real tests Costs of testing Roles of testing A modern VLSI device - system-on-a-chip Course outline Part I: Introduction to testing Part II: Test methods Part III: Design for testability.

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Design and Implementation of VLSI Systems (EN1600) Lecture 18: Scaling Theory

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Transformer Based Oscillators

Transformer Based Oscillators. Adesh Garg. Outline. Why use a Transformer instead of an Inductor? What is a Monolithic Transformer? Physical Layout Equivalent Model Electrical Characteristics Application of Transformers to Oscillator Ring Oscillator LC Tank Oscillator References.

654 views • 13 slides

RISC vs. CISC

RISC vs. CISC. Dhiraj Parashar Shiva Prasad Behera Vivek Sharma. Overview. Introduction Key arguments Comparisons Post-RISC Current Trends. CISC Evolution. Storage and Memory High cost of memory. Need for compact code. Support for high-level languages

998 views • 12 slides

A low-power efficient direct digital frequency synthesizer based on new two-level lookup table

A low-power efficient direct digital frequency synthesizer based on new two-level lookup table. Presenter ? Cheng-Hsun Liang Number:97662003 1 1. Kun-Tse Lee, Jin-Jia Chen Department of Electrical Engineering, NCUE Changhua, Taiwan 500, ROC. Outline. INTRODUCTION

299 views • 12 slides

Enhancements to GTX Sachin Bansal, Andrew B. Kahng, Igor Markov, Mike Oliver, Dirk Stroobandt Calibrating Achievable De

Enhancements to GTX Sachin Bansal, Andrew B. Kahng, Igor Markov, Mike Oliver, Dirk Stroobandt Calibrating Achievable Design Theme

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IV. Conclusion

A 1V Full-band Cascoded UWB LNA with Resistive Feedback Ruey-Lue Wang 1 , Min-Chuan Lin 2 , Chih-Cheng Lin 2 , Cheng-Fu Yang 3. 1 Department of Microelectronic Engineering, National Kaohsiung Marine University, No. 142, Hai-Chuan Rd. Nan-Tzu, Kaohsiung, Taiwan, ROC

125 views • 1 slides