'Test vector' diaporamas de présentation

Digital Testing: Built-in Self-test

Digital Testing: Built-in Self-test. Outline. BIST and embedded testing Why BIST Primitive polynomials LFSR Response compression BILBO. Define Built-In Self-Test. Implement the function of automatic test equipment (ATE) on circuit under test (CUT). Hardware added to CUT:

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Efficient Static Compaction Algorithms for Combinational Circuits Based on Test Relaxation

Efficient Static Compaction Algorithms for Combinational Circuits Based on Test Relaxation. Yahya E. Osais Advisor: Dr. Aiman H. El-Maleh Members: Dr. Sadiq Sait & Dr. Allaeldin Amin Dept. of Computer Engineering KFUPM 11-Oct-03. Outline. Motivation. Research problems & contributions.

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Some Embedded Processor Alternatives; Processors for this course: Introduction to Altera FPGAs

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Professional Encryption Software

Professional Encryption Software. FINECRYPT 8.1. Contents. Introduction Features Installation Tests Results Conclusion. Cryptography Introduction. Study of secret writing

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On the Relation Between Simulation-based and SAT-based Diagnosis

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A Flow Graph Technique for DFT Controller Modification

A Flow Graph Technique for DFT Controller Modification. Mohammad Hosseinabady, Pejman Lotfi-Kamran, Pedram Riahi * , Fabrizio Lombardi * , Zainalabedin Navabi. Electrical and Computer Engineering, University of Tehran, Iran * ECE Department, Northeastern University, USA. Agenda.

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High-Level Test Generation

High-Level Test Generation. Test Generation by Enhancing Validation Test Sets*. * L. Lingappan, et al., VLSI Design, 2007 (Paper available on the class website). Basic Idea. Reuse validation test sequences Fixed control sequence, only data path values need to be determined

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EE434 ASIC & Digital Systems

EE434 ASIC & Digital Systems. Jacob Murray School of EECS Washington State University jmurray@eecs.wsu.edu. Digital Design with VHDL. Lecture 15. Resolved Signals. A resolution function is used to compute a value for a signal based on multiple drivers

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Robust Speech Feature

Robust Speech Feature . Decorrelated and Liftered Filter-Bank Energies (DLFBE) Proposed by K.K. Paliwal , in EuroSpeech 99. DLFBE ---Preliminary. * MFCC is very successful in speech recognition * MFCC computed from the speech signal using

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Chapter 7. Testing of a digital circuit

Chapter 7. Testing of a digital circuit. Reference value. Test pattern source. Circuit under test (C.U.T). Good/bad. Compare. Failure : any departure of a system or module from its specified correct operation. A failure is a malfunction.

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The Boundary Scan Test (BST) technology

The Boundary Scan Test (BST) technology. J. M. Martins Ferreira FEUP / DEEC - Rua Dr. Roberto Frias 4200-537 Porto - PORTUGAL Tel. 351 225 081 748 / Fax: 351 225 081 443 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf). Objectives.

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Aiman El-Maleh and Saqib Khurshid

Efficient Test Compaction for Combinational Circuits Based on Fault Detection Count-Directed Clustering. Aiman El-Maleh and Saqib Khurshid King Fahd University of Petroleum & Minerals, Dept. of Computer Eng., Saudi Arabia. Outline. Motivation Test compaction techniques Proposed Algorithm

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Vector Quantization

Vector Quantization. CAP5015 Fall 2005. Voronoi Region. Blocks: A sequence of audio. A block of image pixels. Formally: vector example: (0.2, 0.3, 0.5, 0.1)

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ECE 667 Spring 2011 Synthesis and Verification of Digital Systems

ECE 667 Spring 2011 Synthesis and Verification of Digital Systems. Verification Introduction. Outline. Motivation: what is verification, why we need it Verification methods Formal methods Simulation-based functional verification Deterministic test generation. ? ?. model. Design 1.

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Yahya E. Osais & Aiman H. El-Maleh

A Static Test Compaction Technique for Combinational Circuits Based on Independent Fault Clustering. Yahya E. Osais & Aiman H. El-Maleh King Fahd University of Petroleum & Minerals, Computer Engineering Department, Dhahran 31261, Saudi Arabia {yosais,aimane}@ccse.kfupm.edu.sa. Outline.

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11ah Tx Reference Code

Date : 2014-01-20. 11ah Tx Reference Code. Authors:. Goal: to clear up any spec interpretation ambiguity and provide reference for implementation Tx Vectors can analyzed for correctness (spec compliance) and used for interoperability testing

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Non-BS cluster testing by PRPG / SA

Non-BS cluster testing by PRPG / SA. J. M. Martins Ferreira FEUP / DEEC - Rua Dr. Roberto Frias 4200-537 Porto - PORTUGAL Tel. 351 225 081 748 / Fax: 351 225 081 443 (jmf@fe.up.pt / http://www.fe.up.pt/~jmf). Objectives.

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To Generate a Single Test Vector to detect all/most number of faults in a given set

To Generate a Single Test Vector to detect all/most number of faults in a given set. Project by: Arvind Raghuraman Course Project ELEC 7250. Problem Statement. The Objective of the project is to determine a test vector that could detect all/most number of faults in a given set.

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Chp 2 Study Guide

Chp 2 Study Guide Answer the following questions on binder paper following the format shown in class. Force is a vector, what two things are needed to describe a vector. Describe magnitude in two different ways. Give two examples of units for a force.

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