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Exploring Sample Preparation Techniques in X-Ray Diffraction: Focus on Aluminum Peaks
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This workshop delves into sample preparation strategies for aluminum peak analysis during X-ray diffraction (XRD). It highlights the significance of specimen holder cavity surface interactions and artifacts in data interpretation. Key discussions include using intense NaCl as a standard for the beam footprint determination on specimen holders. Participants can gain valuable insights into refining their XRD techniques and overcoming common challenges in sample analysis.
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Exploring Sample Preparation Techniques in X-Ray Diffraction: Focus on Aluminum Peaks
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Presentation Transcript
From group A Example of artifacts in data Wow!! Intense NaCl (200) Blue 2c Red 1b Ni Abs edge Kb (111)
Don’t forget that you can use Halite (NaCl) as a template to determine your beam “footprint” on your specimen holders.
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