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Fig.: 12.1

Fig.: 12.1. Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds .): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition. a. F. b. 1. strength or. N. yield criterion. nominal strength s. D. LEBM. D'. specimen dimension (log D). Fig.: 12.2.

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Fig.: 12.1

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  1. Fig.: 12.1 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  2. a F b 1 strength or N yield criterion nominal strength s D LEBM D' specimen dimension (log D) Fig.: 12.2 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  3. a b d c Fig.: 12.3 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  4. MODEL 1362 IN TRON load cell adapter micro-tensile testing device internal load cell 2 0.1 specimen 17.6 0.1 2 1.172 0.1 Fig.: 12.4 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  5. 60 standard specimen l = 50 mm 0 50 25 °C 100 °C 40 175 °C 225 °C s (MPa) 30 microspecimen l = 10 mm 20 0 25 °C 10 100 °C 175 °C 0 0 0.2 0.4 0.6 0.8 1.0 e (%) Fig.: 12.5 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  6. b 0.50 0.45 e 0.40 l 0.35 0.30 0.25 0.20 e (%) 0.15 a 0.10 0.05 0.00 -0.05 -0.10 e q -0.15 -0.20 specimen correlated video image data aquisition Fig.: 12.6 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  7. 0.50 EP + filler (SiO )  = 0.27 2 0.45 PP + chalk  = 0.20 PVC + filler  = 0.22 0.40 0.35  0.30 0.25 0.20 0.15 0.10 0 0.1 0.2 0.3 0.4 e (%) l Fig.: 12.7 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  8. 100 80 60 F (N) 40 standard CT 20 mini CT 0 0 20 40 60 80 100 120 v (µm) Fig.: 12.8 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  9. 150 120 PEI PC 90 PSU PF 60 ceramics PMMA 30 epoxy resin ceramics 0 0 30 60 90 120 150 1/2 K (MPamm ) for mini CT Q 1/2 K (MPamm ) for standard CT Q Fig.: 12.9 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  10. a b load B D A PMMA indenter F (mN) C PS glass interface crack E 0 h (nm) Fig.: 12.10 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  11. a b Fig.: 12.11 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  12. a b Fig.: 12.12 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  13. F optical device scan device a CT specimen loading module F Fig.: 12.13 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  14. a b crack crack line of height profile evaluation 0.28 0.36 10 10 10 10 crack polishing trace height profile height profile 200 180 nm 140 160 nm 100 120 0 10 20 30 0 10 20 30 µm µm Fig.: 12.14 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  15. b a 30 crack flank rigth 25 20 0.1 displacement perpendicular to the crack µm µm 0.0 15 -0.1 10 30 30 25 25 20 5 20 15 15 µm µm 10 10 0 5 5 0 5 10 15 20 25 30 crack flank left µm Fig.: 12.15 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  16. y u r u (x) y r u (x) q y x l u (x) y Fig.: 12.16 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

  17. displacement u (µm) y . -4 7 10 4.5 b a . -4 4.0 6 10 . . -4 -4 y = 2.1 10 x + 6.9 10 3.5 . -4 5 10 3.0 . -4 4 10 2.5 y coordinate (µm) . -4 3 10 2.0 . 1.5 -4 2 10 1.0 . -4 1 10 0.5 0 0 1 2 3 4 0 1 2 3 4 x coordinate (µm) x coordinate (µm) 2 2 u l ((u − u )/2) (µm ) y y Fig.: 12.17 Chapter 12: Michel, B.: Testing of Microcomponents. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

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