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This presentation by Kevin D. McCarthy introduces the fundamentals of Atomic Force Microscopy (AFM), a powerful imaging technique. It explains the working principle of AFM, including the use of laser and photodetectors with high sensitivity to exert controllable forces at the nanonewton scale. The demonstration involves a classroom-scale model that illustrates the AFM imaging mechanism. Attendees will observe how the AFM traces surfaces and reacts to obstacles while maintaining precise measurements of the z-axis motion against horizontal position readings, providing crucial insights into nanoscale imaging.
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Design for AFM demonstration Kevin D. McCarthy 9/28/05
Atomic force microscope AFM: AtomicForce Microscope laser photodetector k ≈ 0.1 N/m
Atomic force microscope, deflected AFM: AtomicForce Microscope laser photodetector k ≈ 0.1 N/m
How it traces surface… z AFM: AtomicForce Microscope Feedback loop
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
AFM: AtomicForce Microscope Vpiezo x
photodetector Optical lever’s sensitivity means nN forces can be controllably exerted… laser k ≈ 0.1 N/m
Design for class-room scale demo of AFM imaging mechanism… “photo-detector” screen Z axis motion… • Wheeled assembly can be rolled over books or other ~1 inch obstacles, while operator tries to maintain dot position on photo-detector screen. • An assistant can be continuously recording (strip-chart style) the ‘z piezo’ reading vs. x (horizontal position) Laser pointer mirror