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Analysis at 7TeV & 4.983 fb -1 and 8TeV & 5.098 fb -1

Analysis at 7TeV & 4.983 fb -1 and 8TeV & 5.098 fb -1. Sep. 19, 2012 Jongseok Lee (Sungkyunkwan University). Used samples. /TTTo2L2Nu2B_8TeV-powheg-pythia6/jslee-v1-Summer12_TTTo2L2Nu2B-f16eeefb6ffa56020dc09a3f8c0db443/USER

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Analysis at 7TeV & 4.983 fb -1 and 8TeV & 5.098 fb -1

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  1. Analysis at 7TeV & 4.983 fb-1 and 8TeV & 5.098 fb-1 Sep. 19, 2012 Jongseok Lee (Sungkyunkwan University)

  2. Used samples /TTTo2L2Nu2B_8TeV-powheg-pythia6/jslee-v1-Summer12_TTTo2L2Nu2B-f16eeefb6ffa56020dc09a3f8c0db443/USER /ZZJetsTo4L_TuneZ2star_8TeV-madgraph-tauola/jslee-v1-Summer12_ZZJetsTo4L-f16eeefb6ffa56020dc09a3f8c0db443/USER /ZZJetsTo2L2Q_TuneZ2star_8TeV-madgraph-tauola/jslee-v1-Summer12_ZZJetsTo2L2Q-f16eeefb6ffa56020dc09a3f8c0db443/USER /WZJetsTo3LNu_TuneZ2_8TeV-madgraph-tauola/jslee-v1-Summer12_WZJetsTo3LNu-f16eeefb6ffa56020dc09a3f8c0db443/USER /WWJetsTo2L2Nu_TuneZ2star_8TeV-madgraph-tauola/jslee-v1-Summer12_WWJetsTo2L2Nu-f16eeefb6ffa56020dc09a3f8c0db443/USER /DYJetsToLL_M-50_TuneZ2Star_8TeV-madgraph-tarball/jslee-v1-Summer12_DYJetsToLL_M-50-f16eeefb6ffa56020dc09a3f8c0db443/USER /DYJetsToLL_M-10To50filter_8TeV-madgraph/jslee-v1-Summer12_DYJetsToLL_M-10To50-f16eeefb6ffa56020dc09a3f8c0db443/USER /T_tW-channel-DR_TuneZ2star_8TeV-powheg-tauola/jslee-v1-Summer12_T_tW-channel-f16eeefb6ffa56020dc09a3f8c0db443/USER /T_s-channel_TuneZ2star_8TeV-powheg-tauola/jslee-v1-Summer12_T_s-channel-f16eeefb6ffa56020dc09a3f8c0db443/USER /Tbar_tW-channel-DR_TuneZ2star_8TeV-powheg-tauola/jslee-v1-Summer12_Tbar_tW-channel-f16eeefb6ffa56020dc09a3f8c0db443/USER /Tbar_t-channel_TuneZ2star_8TeV-powheg-tauola/jslee-v1-Summer12_Tbar_t-channel-f16eeefb6ffa56020dc09a3f8c0db443/USER /DoubleMu/jslee-v1-Summer12_DoubleMu_Run2012A_PromptReco_v1-0c6dd9aa6d8f92e3c92cf94d77ab8809/USER /DoubleMu/jslee-v1-Summer12_DoubleMu_Run2012B_PromptReco_v1-0c6dd9aa6d8f92e3c92cf94d77ab8809/USER /DoubleElectron/jslee-v1-Summer12_DoubleElectron_Run2012A_PromptReco_v1-cbcf422786c4af5101f9b073742156b8/USER /DoubleElectron/jslee-v1-Summer12_DoubleElectron_Run2012B_PromptReco_v1-cbcf422786c4af5101f9b073742156b8/USER /MuEG/jslee-v1-Summer12_MuEG_Run2012A_PromptReco_v1-8bcf723695ea47119dc1f09f98ea2406/USER /MuEG/jslee-v1-Summer12_MuEG_Run2012B_PromptReco_v1-8bcf723695ea47119dc1f09f98ea2406/USER Cross sections : https://twiki.cern.ch/twiki/bin/viewauth/CMS/HZZSamples8TeV

  3. HLT efficiencies(Nhlt/Ngen) • Used paths (8TeV): HLT_Mu17_Mu8 HLT_Ele17_Ele8 HLT_Mu8_Ele17 HLT_Mu17_Ele8 • Used paths (7TeV): • HLT_DoubleMu7 • HLT_Mu13_Mu8 HLT_Mu17_Mu8 HLT_Ele17_Ele8 HLT_Mu8_Ele17 HLT_Mu17_Ele8

  4. Skim efficiencies(Nskim/Nhlt) • Skim conditions : firstpt>15 GeV && secondpt>10 GeV for e, μ

  5. Electron cut variables ne>=2, pt>10, |η|<2.5, eidLoose, relIso<0.2 7TeV, 4.983 fb-1 7TeV, 4.983 fb-1 7TeV, 4.983 fb-1 8TeV, 5.098 fb-1 8TeV, 5.098 fb-1 8TeV, 5.098 fb-1

  6. Electron cut variables ne>=2, pt>10, |η|<2.5, eidLoose, relIso<0.2 7TeV, 4.983 fb-1 7TeV, 4.983 fb-1 7TeV, 4.983 fb-1 8TeV, 5.098 fb-1 8TeV, 5.098 fb-1 8TeV, 5.098 fb-1

  7. el_dz ne>=2, pt>10, |η|<2.5, eidLoose, relIso<0.2 8TeV, 5.098 fb-1

  8. Corrected relIso ne>=2, pt>10, |η|<2.5, eidLoose, relIso<0.2 7TeV, 4.983 fb-1 7TeV, 4.983 fb-1 8TeV, 5.098 fb-1 8TeV, 5.098 fb-1

  9. Mee ne>=2, pt>10, |η|<2.5, eidLoose, relIso<0.2 8TeV, 5.098 fb-1 8TeV, 5.098 fb-1

  10. Primary vertex nlep>=2, relIso<0.2 normalized chi2 7TeV, 4.983 fb-1 # of vertices 7TeV, 4.983 fb-1 normalized chi2 8TeV, 5.098 fb-1 # of vertices 8TeV, 5.098 fb-1

  11. Primary vertex nlep>=2, relIso<0.2 rho position 7TeV, 4.983 fb-1 z position 7TeV, 4.983 fb-1 rho position 8TeV, 5.098 fb-1 z position 8TeV, 5.098 fb-1

  12. Sideband method

  13. # of events at 7TeV & 4.983fb-1 nlep+>=2, nlep->=2, relIso<0.5, mp>10, in signal region (5σ) ± α error ± relative error ± statistical error

  14. # of events at 7TeV & 4.983fb-1 nlep+>=2, nlep->=2, relIso<0.5, mp>10, in signal region (5σ) ± α error ± relative error ± statistical error

  15. # of events at 7TeV & 4.983fb-1 nlep+>=2, nlep->=2, relIso<0.5, mp>10, in signal region (5σ) ± α error ± relative error ± statistical error

  16. Weekly plan • PF2PAT sample production for 2012 data • ABCD method for background estimation

  17. backup

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