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PC4250 Introduction to Surface Analysis Techniques

PC4250 Introduction to Surface Analysis Techniques. References for Surface Science. Main text: Vickerman (ed) Surface Analysis, Wiley 1997 Further Reading: Woodruff & Delchar, Modern Techniques of Surface Science, CUP 1986 Wiesendanger, Scanning Probe Microscopy and Spectroscopy, CUP 1994

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PC4250 Introduction to Surface Analysis Techniques

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  1. PC4250Introduction to Surface Analysis Techniques

  2. References for Surface Science Main text: • Vickerman (ed) Surface Analysis, Wiley 1997 Further Reading: • Woodruff & Delchar, Modern Techniques of Surface Science, CUP 1986 • Wiesendanger, Scanning Probe Microscopy and Spectroscopy, CUP 1994 On-line resources: • http://www.uksaf.org/tutorials.html

  3. Ref: http://www.er.doe.gov/production/bes/scale_of_things.html

  4. Surface Science Lab NUS UHV systems: • VG ESCA MkII/SIMSLAB • Cameca IMS 6f Magnetic sector SIMS) • VT-STM/XPS/LEED system + growth chamber with molecular beam & reactive atom sources [+ cryogenic STM] • Soft X-ray synchrotron end station on SINS beamline [+ growth chamber + STM/AFM] • [EXAFS endstation]

  5. Surface Techniques • Most physics techniques can be classified as scattering experiments: a particle is incident on the sample, and another particle (not necessarily the same) is detected after the interaction with the sample. • Surface Physics is no exception: we can think of an incident Probe X and a Response Y. If we understand the nature/physics of the scattering, then we can interpret the experiment and deduce the corresponding characteristics of the sample.

  6. Overview of techniques

  7. Reasons for surface sensitivity • The incident particle or the probe particle has a short mean free path, . • XPS - emerging electrons in the energy range 50-1000 eV have  for inelastic scattering in solids, of order 1 nm or less. • LEED - both the incident and the emergent electrons have short mean free paths for energy loss processes • SIMS - emergent ions have a very high probability of being neutralised if they do not originate very near the surface. • The sample has a large surface to volume ratio. • allows us to extract surface information from techniques which are not particularly surface sensitive. • use powdered/exfoliated samples and perform heat capacity or other thermodynamic measurements, X-ray or neutron scattering • use thin film samples and concentrate on the surface-related contribution; e.g. TEM done on thin films around 10-100 nm thick.

  8. Primary Particle Probes

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