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Signal Quality

This document provides a comprehensive summary of the radiation test results for the 54HCT244 octal buffer driver, manufactured by Har, and tested at JPL. The tests were conducted in accordance with MIL-STD-883 Method 1019. It includes the compliance status of the transition times (tT) at varying radiation doses, with detailed parameters and specifications. This report encompasses tests performed on engineering samples with log numbers 1440 and 1492, highlighting key failure levels and compliance metrics.

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Signal Quality

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  1. Signal Quality

  2. Transition Time (tT) Compliance DATE: 5-21-90 RADIATION TEST RESULTS SUMMARY DEVICE TYPE AND DESCRIPTION: 54HCTS244 (SOS) OCTAL BUFFER DRIVER(ENGINEERING SAMPLES) MANUFACTURER: HAR FACILITY: JPL ENERGY: 1.25MeV LOG NUMBER: 1440 PACKAGE TYPE: 20 PIN DIP RTR: 445B LOT NUMBER: 72010 TEST DATE: 3-13-90 DATE CODE: P8747 SAMPLE SIZE: 3 + CONTROL ----------------------------------------------------------------------------- DOSE LEVELS AND RATE, RAD(SI): 15K, 40K, 75K, 100K, 200K, 400K, 800K, AND 1000K RADS AT 100 RAD(Si)/SECOND PIE IN HOURS: 1, 3, 24, 72, 168, AND 336 HOUR ----------------------------------------------------------------------------- COMMENTS: 3) IRRADIATION TEST CONDUCTED IN ACCORDANCE WITH MIL-STD-883 METHOD 1019.3. 4) BIAS DURING IRRADIATION: INPUTS HIGH, OUPUTS HIGH, TRI-STATED PARAMETER TEST CONDITIONS FAIL LEVEL COMMENTS ----------- ----------------- -------------- --------------------- 1) ICCH SEE NOTE 2 40 KRADS(SI) SPEC. LIMIT = 40 UA 2) ICCL SEE NOTE 2 40 KRADS(SI) SPEC. LIMIT = 40 UA 3) VOH1 SEE NOTE 2 800 KRADS(SI) SPEC. LIMIT = 4.4 V 4) VOL1 SEE NOTE 2 800 KRADS(SI) SPEC. LIMIT = 10 MV 5) IOZH SEE NOTE 2 15 KRADS(SI) SPEC. LIMIT = 1 UA 6) TPHL SEE NOTE 2 75 KRADS(SI) RAD. LIMIT = 26 NS 7) TPLH SEE NOTE 2 168 HOUR PIE SPEC. LIMIT = 17 NS 8) TTLH SEE NOTE 2 15 KRADS(SI) SPEC. LIMIT = 12 NS 9) TTHL SEE NOTE 2 400 KRADS(SI) RAD. LIMIT = 16 NS From: http://radnet.jpl.nasa.gov/TID/1440.TXT

  3. Transition Time (tT) Compliance 01/20/92 PAGE 1 RADIATION AND PIE TEST RESULTS DEVICE TYPE: 54HCT244; OCTAL BUFFER LINE DRIVER MANUFACTURER: TIX LOG NUMBER: 1492 PACKAGE TYPE: DIP RAD TEST REQ.: 445D-1 TEST DATE: 07/11/91 LOT NO.: N/A DATE CODE: N/A FACILITY: Co60 SAMPLE SIZE: 3 + CONTROL U NO. FAILURE LEVELS PARAMEETER LIMITS N PINS ----------------- ----------------------------------- PARAMETER I /PARAM. Spec. Rad. Req. Specification Radiation Request NAME T /DEVICE * @ # * @ # ---------------------------------------------------------------------------- TTLH S 8 1K MAX 1.20-08 1.60-08 TTHL S 8 INITI INITI MAX 1.20-08 1.60-08 ---------------------------------------------------------------------------- * = EXCEEDED VENDOR'S PARAMETRIC SPECIFICATION LIMIT. @ = EXCEEDED VENDOR'S RADIATION PARAMETRIC SPECIFICATION LIMIT. http://radnet.jpl.nasa.gov/TID/1492.TXT

  4. Transition Time (tTHL)High-Speed: RT54SX16

  5. Transition Time (tTLH)High-Speed: RT54SX16

  6. Transition Time (tTHL)High-Speed: QL3025

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