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Evaluation of Electronic Component Dependability Under Radiation Testing Conditions

This paper discusses the SIL approach to assessing the dependability of electronic components subjected to radiation. It presents findings from various tests on irradiated components such as lasers and photodiodes, focusing on their performance under specific radiation levels. BIDI lasers faced challenges during irradiation, while Photontec lasers exhibited no issues. Similarly, while ITEC photodiodes proved reliable up to 500 Gy, Photontec components demonstrated durability close to 700 Gy. These insights are crucial for ensuring the reliability of electronic systems in radiation-rich environments.

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Evaluation of Electronic Component Dependability Under Radiation Testing Conditions

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  1. SIL Approach Electronic Our Situation Radiations Tests Dump Levels Irradiated Components BLM Dependability. G.Guaglio

  2. SIL Approach Electronic Our Situation Radiations Tests Dump Levels BIDI Lasers Irradiation ITEC lasers had some problems during irradiation. Photontec ones no. BLM Dependability. G.Guaglio

  3. SIL Approach Electronic Our Situation Radiations Tests Dump Levels BIDI Photodiodes Irradiation ITEC PD good up to 500 Gy. Photontec ones die around 700Gy. BLM Dependability. G.Guaglio

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