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Please note that the Reception class for the course has been rescheduled from Sunday to Monday next week. Additionally, this announcement covers vital information regarding sources of errors in low-noise design, including the noise models of BJT, JFET, and MOSFET devices. Each model presents unique error sources that impact circuit performance. Understanding these principles is crucial for designing effective low-noise electronics. Stay tuned for more details during the class.
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Announcements 1. Course assistant reception day in the next week: Monday instead of Sunday.
5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design 5.5. Fundamentals of low-noise design
vbt2= 4kTrb icsh2= 2qIC ibsh2= 2qIB Kf IB f ibf 2= 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.2. BJT noise model 5.5.2. BJT noise model C Noiseless vbt rb B icsh ibf ibsh E NB: icf =0 ict =0
5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model 5.4.3. JFET noise model D Noiseless G idf idt igsh S igsh2= 2qIG idt2= 4kT/(3/2gm) Kf ID f idf 2= NB: idsh =0
id vgs 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model Equivalent small-signal model gmvgs ig G D rgs ro igsh idf idt
id vgs vgs 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model Equivalent small-signal model gmvgs ig G D rgs ro 1/gm igsh idf idt
vgs 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model Equivalent small-signal model gmvgs ig G D ro ~1/gm igsh idf idt
RS id vs vgs ? vn s 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model A. Total input noise gmvgs ig G D ro ~1/gm igsh idf idt 1) Total input noise vs. time, vn s(t).
igsh Rs RS vs ? vn s vn s(t)=vst(t)+igsh(t)RS+[idf (t)+idt(t)](1/gm) 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model A. Total input noise gmvgs ig G D id vgs ro ~1/gm igsh idf idt 1) Total input noise vs. time, vn s(t).
RS vs ? vn s vn s vn s(t)=vst(t)+igsh(t)RS+[idf (t)+idt(t)](1/gm) 2) Power spectral density of the total input noise, vn s2(f). vn s2=4kTRS +igsh2RS2+(idf 2+idt2)/gm2 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model A. Total input noise gmvgs igsh Rs ig G D id vgs ro ~1/gm idf idt 1) Total input noise vs. time, vn s(t).
en in ? vn s vn s en2= vn s2= (idf 2+idt2)/gm2 RS = RS =0 vn s2 RS2 in2==igsh2 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model B. en- in noise model gmvgs igsh Rs RS ig G D id vs vgs ro ~1/gm idf idt vn s2=4kTRS +igsh2RS2+(idf 2+idt2)/gm2
en in 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.3. JFET noise model BJT JFET en- in noise model f >> ff Vp = 2 V IDSS= 10 mA IG = 10 pA en=1.8 nV/Hz0.5 in=1.8 fA/Hz0.5 en /in=1 MW RS= 1 MW in RS= 1.8 nV/Hz0.5 f >> ff rb= 100 W IC = 1 mA hfe= 100 en=1.36 nV/Hz0.5 in=1.8 pA/Hz0.5 en /in=756 W RS= 756 W in RS= 1.4 nV/Hz0.5 D G S en2= (idf 2+idt2)/gm2 in2=igsh2
idt2= 4kT/(3/2gm) Kf ID f idf 2= 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.4. MOSFET noise model 5.5.4. MOSFET noise model D Noiseless G idt idf S NB: igsh =0 idsh =0
RS id vs ? vn s vn s vn s(t)= vst(t)+[idf (t)+idt(t)](1/gm) vn s2=4kTRS +(idf 2+idt2)/gm2 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.4. MOSFET noise model A. Total input noise gmvgs G D ro 1/gm idf idt 1) Total input noise vs. time, vn s(t). 2) Power spectral density of the total input noise, vn s2(f).
en in en2= vn s2= (idf 2+idt2)/gm2 RS = RS =0 vn s2 Rs2 in2== 0 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.4. MOSFET noise model B. en- in noise model vn s gmvgs RS G D id vs ro 1/gm vn s2=4kTRS +(idf 2 +idt2)/gm2
5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.4. MOSFET noise model JFET MOSFET en- in noise model f >> ff Vp = 2 V IDSS= 10 mA IG = 10 pA en=1.8 nV/Hz0.5 in=1.8 fA/Hz0.5 en /in=1 MW RS= 1 MW in RS= 1.8 nV/Hz0.5 f >> ff Vp = 2 V IDSS= 10 mA en=1.8 nV/Hz0.5 D en G S en2= (idf 2+idt2)/gm2 in= 0
5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect 5.5.5. Frequency response effect The aim is to analyze the dependence of a transistor en and in on frequency and the operating point. VCC iC RS vs VBB Cm vbt vbt RS rb B C hfe ip ic ip Cp vs icsh rp ro ibf ibsh
5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect A. Total input noise Cm RS rb is B C hfe ip ic ip Cp vs rp ro 1) Transconductance gain ic vs hfe [1/j2pf(Cp+Cm )]/[rp+1/j2pf(Cp+Cm )] RS +rb+rpII[1/j2pf(Cp+Cm )] ___ Ag = ____________________________________ is=1 hfe /(RS +rb+rp ) 1+j2pft = _____________ , t = [(RS + rb)IIrp ](Cp+Cm )
vn s 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect Cm vbt vbt RS rb B C hfe ip ic ip Cp vs icsh rp ro ibf ibsh hfe /(RS +rb+rp ) 1+j2pft Ag= _____________ , t = [(RS + rb)IIrp ](Cp+Cm ) 2) Power spectral density of the total input noise, vn s2(f). RS +rb+rp hfe 2 [1+(2pft)2] icsh2 vn s2=4kT(RS +rb)+(ibf 2+ibsh2)(RS+rb)2+
RS = RS =0 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect RS +rb+rp hfe 2 [1+(2pft)2] icsh2 vn s2=4kT(RS +rb)+(ibf 2+ibsh2)(RS+rb)2+ 3) en and in of the transistor. rb+rp hfe 2 en2= vn s2= 4kTrb+(ibf 2+ibsh2)rb2 + [1+(2pften)2] icsh2 ten= (rbIIrp )(Cp+Cm ) icsh2 hfe2 vn s2 RS2 = ibf 2+ibsh2 + [1+(2pftin)2] in2= tin= rp (Cp+Cm )
en in 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect B. en- in noise model for high-frequencies Cm RS rb B C hfe ip ic ip Cp vs rp ro rb+rp hfe 2 en2= 4kTrb+(ibf 2+ibsh2)rb2 + [1+(2pften)2] icsh2 icsh2 hfe2 ibf 2+ibsh2 + [1+(2pftin)2] in2=
5 0 4 -20 3 2 -40 1 Ag Ag max dB 100 101 102 103 104 105 106 107 108 109 ____ 100 101 102 103 104 105 106 107 108 109 f, Hz 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect C. en(f)for differentIC rb+rp hfe 2 en2= 4kTrb+(ibf 2+ibsh2)rb2 + [1+(2pften)2] icsh2 IC opt= 24 mA IC = 0.1 mA en(f) nV/Hz0.5 rb= 100 W hfe= 100 Cm = 1 pF Cp (1 mA)= 100 pF
8 0 6 -20 4 2 -40 0 Ag Ag max dB ____ 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect D. in(f)for differentIC icsh2 hfe2 ibf 2+ibsh2 + [1+(2pftin)2] in2= IC opt= 24 mA IC = 0.1 mA in(f) pA/Hz0.5 100 101 102 103 104 105 106 107 108 109 rb= 100 W hfe= 100 Cm = 1 pF Cp (1 mA)= 100 pF 100 101 102 103 104 105 106 107 108 109 f, Hz
V(INOISE)*1G V(Out1)/V(V1:+)/10 V(ONOISE)*1G/10 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect E. Noise simulation inPSPICE 30 20 10 0 1.0Hz 10KHz 100MHz 1.0THz Frequency
rb= 40 W hfe= 500 ro = IC = 1 mA IDSS= 2 mA Vp= 2 V ro = ID = 1 mA RS+rb+rp hfe 2 icsh2 vn s2=4kT(rb+ RS) +(ibf 2+ibsh2)(RS+rb)2+ vn s2=4kTRS +igsh2RS2+(idf 2+idt2)/gm2 vn s2=4kTRS +(idf 2+idt2)/gm2 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.6. Comparison of the BJT, JFET and MOSFET 5.5.6. Comparison of the BJT, JFET and MOSFET
IC opt 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.6. Comparison of the BJT, JFET and MOSFET 100 Power spectral density of the total input noise vn s as a function of RS vn s nV/Hz0.5 5 The 1/f noise is neglected. The JFET gate current is neglected. 1 102 103 104 105 RS, W
5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.6. Comparison of the BJT, JFET and MOSFET MOSFET Guide for selection of the preamplifier JFET IC amplifiers BJT Transformer coupling 1 10 100 1 k 10 k 100 k 1 M 10 M 100 M 1 G 10 G 100 G Source resistance, RS Reference: [9]
RS = 100 W RS = 10 kW 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.5. Frequency response effect Example: Comparison of an BJT and JFET in PSPICE
vbt rb B C hfe ip ip io icsh rp ro vst ibf ibsh E RS vct vet vs RE RC 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit 5.5.7 Noise analysis of a CE amplifier VCC RC RS vs RE VBB ro
? vn s 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit • Our final aim is to find and minimize the total input noise vn s. vbt rb B C hfe ip ip io icsh rp vst ibf ibsh E RS vet vct vs RE RC • Let us first find vn s by applying superposition.
io vs AOL 1+AOLb As =Gs + Gs bs fwd ___ _______ hfe 1+hfe RE/(RE +RS+rb+rp) 1 RS+rb+rp+RE As= +0 ____________________ ___________ 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit • 1) Signal gain As for vs, vst, vbt, and vet. vbt rb B C hfe ip ip io rp vst E RS vet vs RE RC
io ibf AOL 1+AOLb Abf =Gibf + Gbf bbf fwd ___ _______ RS+rb+RE RS+rb+RE +rp hfe 1+hfe RE/(RE +RS+rb+rp) Abf= +0 ____________________ ___________ 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit • 2) Noise gain Abf for ibf and ibsh. rb B C hfe ip ip io rp ibf ibsh E RS vs RE RC
io icsh AOL 1+AOLb Acsh =Gcsh + Gcsh bcsh fwd ___ _______ hfe 1+hfe RE/(RE +RS+rb+rp) RE RE +RS+rb+rp Acsh= +1 ____________________ - ___________ 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit • 3) Noise gain Acsh for icsh. rb B C hfe ip ip io icsh rp E RS vs RE RC
io ict AOL 1+AOLb Act =Gct + Gct bct fwd ___ _______ 1 RC Acsh= ___ 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit • 4) Noise gain Act for icsh. rb B C hfe ip ip rp E RS io vs vct /RC RE RC
vn s (ibf +ibsh)Abf As icsh Acsh As vct Act As vn s(t) = vst +vbt +vet + + + __________ _______ _____ (RSbE+rp)2 hfe2 1 RC As2 +icsh2 + 4kT ________ _____ vn s2(f) = 4kTRSbE+(ibf 2+ibsh2)RSbE2 0 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit • 5) Total input noise vs. time, vn s. rb B C hfe ip ip io rp RS E vs RE RC RSbE =RS +rb+RE
rb en in E RE (RbE+rp)2 hfe2 en2 =en s2 =4kTRbE+(ibf 2+ibsh2) RbE2+ icsh2 RS = RS =0 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit 6) en- in noise model. B C hfe ip ic ip rp RC E RS vs (1+hfe)RE RbE= rb +RE icsh2 hfe2 en s2 RS2 in2 ==ibf 2+ibsh2+
0 1.4 1.2 -0.1 en s norm. dB en s norm. dB 1.0 hfe=104 -0.2 0.8 hfe=103 0.6 hfe=102 -0.3 0.4 -0.4 0.2 0 -0.5 102 103 104 0.1 10 10 IC /IC opt hfe hfeVT (1+ hfe )0.5RSbE IC opt= (1+hfe )0.5 (1+hfe )0.5-1 vn s min2=4kTRSbE 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. 5.5.7. Example circuit 7) Minimizing CE noise. rb= 100 RS= 200 RE= 200 ibf 2= 0 vbt2= 4kTrb vet2= 4kTRE ibsh2= 2qIC /bicsh2= 2qIC 2 RSbE2 hfe RSbE+hfeVT /IC hfe vn s2= 4kTRSbE+ 2qIC +2qIC Reference: [7]
Next lecture Appendix: Noise analysis of the CE without applications of superposition Reference: [7]
vbst rb B ip C hfe ip ic icsh ? rp ro RC vn s ibf ibsh E RS vet vs RE 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis Noise analysis of a CE amplifier VCC RC RS vs RE VBB
ibf ibsh ibf ibsh 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 1) Disconnecting ibf and ibsh sources. vbst rb B ip C hfe ip ic icsh ? rp ro RC vn s E RS vet vs RE
vbst ibf ibf ibsh ibsh vne= vet -(ibf + ibsh)RE 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 1) Disconnecting ibf and ibsh sources. rb B ip C hfe ip ic icsh ? rp ro RC vn s E RS vet vs RE
vbst +(ibf + ibsh)(Rs + rb) vbst ibf ibsh vne= vet -(ibf + ibsh)RE 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 1) Disconnecting ibf and ibsh sources. rb B ip C hfe ip ic ip icsh ? rp ro RC vn s E RS vet vs RE
vbst +(ibf + ibsh)(Rs + rb) 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 2) Disconnecting ibf and ibsh sources. rb ro B C hfe ip ic ip icsh ? rp ro RC vn s E RS vne= vet -(ibf + ibsh)RE vet vs RE
vbst +(ibf + ibsh)(Rs + rb) 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 2) Disconnecting ibf and ibsh sources. rb B C hfe ip ic ip icsh ? rp RC vn s E RS vne= vet -(ibf + ibsh)RE vet vs RE
vbst +(ibf + ibsh)(Rs + rb) 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 2) Disconnecting ibf and ibsh sources. rb B C hfe ip ic ip icsh ? rp RC vn s E RS vne= vet -(ibf + ibsh)RE vne= vet -(ibf + ibsh)RE +icsh RE vet vs (1+hfe)RE RE
vbst +(ibf + ibsh)(Rs + rb) RS+rb+rp+(1+hfe)RE hfe vn s(t)= ic(t) vn s(t)=vbst(t)-vet(t)+[ibf (t)+ibsh(t)] R*+ ? 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 3) Reflecting ibf and ibsh to vn s. rb B C hfe ip ic ip icsh ? rp RC vn s E RS vne= vet -(ibf + ibsh)RE +icsh RE vs (1+hfe)RE R*= RS +rb +RE
RS+rb+rp+(1+hfe)RE hfe hfe RS+rb+rp+(1+hfe)RE - ic(t) , 1) vn s= - icsh (t)RE +icsh (t) 2) ic= R*+ rp hfe RS+rb+rp+(1+hfe)RE hfe = icsh (t) - icsh (t)RE+icsh (t) 3) vn s= 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 3) Reflecting icsh to vn s. rb B C hfe ip ic ip icsh ? rp RC vn s E RS icsc RE vs (1+hfe)RE R*= RS +rb +RE
R*+rp hfe vn s(t)=vbst(t)-vet(t)+[ibf (t)+ibsh(t)] R*+ icsh (t) 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 4) Total input noise vs. time, vn s(t). rb B C hfe ip ic ip rp RC vn s E RS vs (1+hfe)RE R*= RS +rb +RE
E RE R*+rp hfe 2 vn s2 =4kTR*+(ibf 2+ibsh2) R*2+ icsh2 5. SOURCES OF ERRORS. 5.5. Fundamentals of low-noise design. Appendix: conventional noise analysis 5) Power spectral density of the total input noise, vn s2. rb B C hfe ip ic ip rp RC vn s E RS vs (1+hfe)RE R*= RS +rb +RE R*+rp hfe vn s(t)=vbst(t)-vet(t)+[ibf (t)+ibsh(t)] R*+ icsh (t)
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