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Strength Design Maps for Nanoscale Metallic Multilayer Thin Films

This project, led by Peter M. Anderson of Ohio State University, focuses on developing strength design maps for nanoscale metallic multilayer thin films. Utilizing techniques such as plan-view transmission electron microscopy and X-ray diffraction, this research aims to assess the internal stress states in these films. Collaborators contribute through atomistic simulations to study interfacial barrier strength, and micropillar compression testing provides insights into material performance. The educational outreach component engages high school and college students through discovery-based learning.

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Strength Design Maps for Nanoscale Metallic Multilayer Thin Films

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  1. Strength Design Maps for Nanoscale Metallic Multilayer Thin FilmsPeter M. Anderson, Ohio State University, DMR 0508987 • Strength design maps for multilayer thin films Strength design maps Plan-view transmission Electron microscopy (courtesy D Mitlin) X-ray diffraction to determine internal stress state (w/A Misra) Atomistics to study interfacial barrier strength to slip transmission (w/R Hoagland) Micropillar compression testing (w/M Uchic)

  2. Strength Design Maps for Nanoscale Metallic Multilayer Thin FilmsPeter M. Anderson, Ohio State University, DMR-0508987 • Outreach Learning • High school & college • Discovery-based • Developers: Click on a green dot! • Single web page integrates • reading • movies • self-assessment questions Caesar Buie • Senior • Materials Science • Ohio State Univ. John Carpenter • Graduate Student • Materials Science • Ohio State Univ.

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