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Detailed status of Muon Sorter board testing plans, including hardware/firmware tests, VME access checks, FPGA latency tests, and plans for Sector Processor integration testing.
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CSC Muon Sorter Status Tests Plans M.Matveev August 21, 2003
Status • Have one assembled MS board with a mezzanine FPGA • Three other boards have been assembled and partially tested without mezzanines • Have a dedicated test stand - 9U crate with Track Finder Backplane - MS with mezzanine FPGA - Clock and Control Board - SBS 620 VME controller - Linux PC
Hardware/Firmware Tests • VME Access to FPGA and JTAG controller was checked. • Extensive tests of sorting logic and LUTs • Front panel connection to GMT was verified with a loopback cable FPGA
VME/JTAG Interface XILINX PARALLEL CABLE TDI TCK TMS Xilinx XC2V4000 mezzanine FPGA and associated EPROM’s may be loaded/programmed from: • Xilinx Parallel Cable IV • Fairchild SCANPSC100F JTAG controller under VME control MUX FAIRCHILD SCANPSC100 TDO XILINX FPGA XILINX PLD VME National Semiconductor provides a free software to operate SCANPSC100F controller, that was adopted by UF to work via VME using SBS 620 Master. • We have successfully run this software to program 4 EPROM’s residing on the mezzanine card • Program time is ~1 min (~4 min over Xilinx Parallel Cable IV)
FPGA Latency F=45 Mhz
Tests with Sector Processor For initial tests we need one Sector Processor with mezzanine FPGA installed and minimal firmware: • Output 512*32 memory buffer for data to be sent to MS • Input 512*2 memory buffer for “winner” bits from MS Memory buffers can be either FIFO’s or dual-port RAM’s. Both must be under VME control. Verilog implementation of the dual-port RAM can be borrowed from the TMB design and adopted for SP.
Plans Continue bench testing when SP is available • Data consistency check • Winner logic • Latency Tests with Global Muon Trigger Integrated test of the peripheral/TF electronics