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Chapter 4 – RFID tag chip design. Figure 4.1 Tag system architecture. Figure 4.2 The “frame-sync” sequence of Gen2 protocol. Figure 4.3 Multi-level supply voltage generation. Figure 4.4 An N-stage Dickson charge pump.
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Figure 4.5 The factors affecting the power conversion efficiency of the charge pump
Figure 4.6 Charge pump circuit with self-threshold compensation
Figure 4.7 Charge pump circuit with constant threshold compensation and substrate shift
Figure 4.8 Symmetrical charge pump circuit with dynamic threshold compensation
Figure 4.12 Schematic (a) control capacitor Mc and tunneling capacitor Mt (b) cross section
Figure 4.14 (a)Voltage-mode sense amplifier (b) Current-mode sense amplifier
Figure 4.16 Decode Margin for 1.28 MHz with 5% clock uncertainty (violations marked with the circle)
Figure 4.17 Decode Margin for 1.92 MHz with 5% clock uncertainty
Figure 4.18 BLF error when clock rate is 1.28 MHz (violations marked with the circle)
Figure 4.21 Example of adiabatic CMOS circuit (left) versus standard CMOS Logic (right)
Figure 4.23 The different package of on-chip antenna and tag chip