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Built-In Self-Test for 3 rd -Generation Mobile Users

Built-In Self-Test for 3 rd -Generation Mobile Users. John Sunwoo Electrical and Computer Engineering Department Auburn University, AL. Smart Phones. Download mp3 files and listen. Online shopping Online gaming GPS Mobile pay Wireless Key Start the car. Paying School Tuition.

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Built-In Self-Test for 3 rd -Generation Mobile Users

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  1. Built-In Self-Test for 3rd-Generation Mobile Users John Sunwoo Electrical and Computer Engineering Department Auburn University, AL

  2. Smart Phones • Download mp3 files and listen. • Online shopping • Online gaming • GPS • Mobile pay • Wireless Key • Start the car

  3. Paying School Tuition Are you sure you are paying $5,000, not $50,000?

  4. Near future

  5. Objective • Extensive usage of data transmissions via mobile devices • Tx/Rx of critical data • Make sure your mobile phone has no fault • Users need to have access to high-level functional test • The testing operation should be easy • BIST for users

  6. History of mobile communications • 2G has limited data capability

  7. Cellular network • Base station is located each cell • Base station has physical connection to phone/data line • One user connect to other users via base stations

  8. TDMA vs CDMA • TDMA: Time Division Multiple Access • Allows a number of users to access RF channel without interference by allocating unique time slots to each user within each channel • CDMA: Code Division Multiple Access • Every communicator will be allocated the entire channel all the time by having different code than the others

  9. 2G to 3G… Test challenges? • 3G testing are related to the fact that it is fundamentally different than testing 2G networks • Adjustment with just a power meter. (2G) • Scan multiple neighboring base stations for interference that may affect network performance. (3G)

  10. Case Study

  11. Model • Samsung SPH-I500 PDA Phone • $500 ~ $600 • CDMA 800Mhz/1900Mhz • Built-in memory 32MB

  12. USB Interface

  13. Inside • CDMA Processor • Base band-to-radio frequency transmit processor • IF-to-base band processor • RF-to-IF processor

  14. My BIST Approach • Test control: Via USB • TPG: CDMA processor • ORA: CDMA processor • DUT: Transceiver circuitry • RFT3100 -> Power amplifier -> RFR3300 -> IFR3300

  15. Plan -BIST start-No need of additional hardware within certain assumptions. (Making assumptions means the design is could be very vague)-Is it an effective test? (Diagnostic resolution)

  16. How did others tested RF device? • Dr. Chatterjee • Test point insertion algorithm for determining the best nodes for sensor insertion • Sensors outputs can predict system and module specifications • Area overhead < 15%

  17. Dr. Dabrowski (Sweden)

  18. Drawbacks • John have never took RF classes. (Major) • Qualcomm never responds my email for asking the actual data sheet of the MSM5100 modem.

  19. Conclusions • The applicability of the presented BIST has only for the higher-level model • Mainly useful for hard faults such as spot defects rather than parametric faults. • Only applicable in a stable production process or after the production. • Exactly what consumer want

  20. Good and Bad • Avoids affecting the internal RF parts to noise or external disturbances. • Fault diagnosis is not possible.

  21. Future work • Bluetooth Testing • 2.4GHz • No published paper on Bluetooth BIST

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