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Built-In Self-Test for 3 rd -Generation Mobile Users PowerPoint Presentation
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Built-In Self-Test for 3 rd -Generation Mobile Users

Built-In Self-Test for 3 rd -Generation Mobile Users

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Built-In Self-Test for 3 rd -Generation Mobile Users

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  1. Built-In Self-Test for 3rd-Generation Mobile Users John Sunwoo Electrical and Computer Engineering Department Auburn University, AL

  2. Smart Phones • Download mp3 files and listen. • Online shopping • Online gaming • GPS • Mobile pay • Wireless Key • Start the car

  3. Paying School Tuition Are you sure you are paying $5,000, not $50,000?

  4. Near future

  5. Objective • Extensive usage of data transmissions via mobile devices • Tx/Rx of critical data • Make sure your mobile phone has no fault • Users need to have access to high-level functional test • The testing operation should be easy • BIST for users

  6. History of mobile communications • 2G has limited data capability

  7. Cellular network • Base station is located each cell • Base station has physical connection to phone/data line • One user connect to other users via base stations

  8. TDMA vs CDMA • TDMA: Time Division Multiple Access • Allows a number of users to access RF channel without interference by allocating unique time slots to each user within each channel • CDMA: Code Division Multiple Access • Every communicator will be allocated the entire channel all the time by having different code than the others

  9. 2G to 3G… Test challenges? • 3G testing are related to the fact that it is fundamentally different than testing 2G networks • Adjustment with just a power meter. (2G) • Scan multiple neighboring base stations for interference that may affect network performance. (3G)

  10. Case Study

  11. Model • Samsung SPH-I500 PDA Phone • $500 ~ $600 • CDMA 800Mhz/1900Mhz • Built-in memory 32MB

  12. USB Interface

  13. Inside • CDMA Processor • Base band-to-radio frequency transmit processor • IF-to-base band processor • RF-to-IF processor

  14. My BIST Approach • Test control: Via USB • TPG: CDMA processor • ORA: CDMA processor • DUT: Transceiver circuitry • RFT3100 -> Power amplifier -> RFR3300 -> IFR3300

  15. Plan -BIST start-No need of additional hardware within certain assumptions. (Making assumptions means the design is could be very vague)-Is it an effective test? (Diagnostic resolution)

  16. How did others tested RF device? • Dr. Chatterjee • Test point insertion algorithm for determining the best nodes for sensor insertion • Sensors outputs can predict system and module specifications • Area overhead < 15%

  17. Dr. Dabrowski (Sweden)

  18. Drawbacks • John have never took RF classes. (Major) • Qualcomm never responds my email for asking the actual data sheet of the MSM5100 modem.

  19. Conclusions • The applicability of the presented BIST has only for the higher-level model • Mainly useful for hard faults such as spot defects rather than parametric faults. • Only applicable in a stable production process or after the production. • Exactly what consumer want

  20. Good and Bad • Avoids affecting the internal RF parts to noise or external disturbances. • Fault diagnosis is not possible.

  21. Future work • Bluetooth Testing • 2.4GHz • No published paper on Bluetooth BIST