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Analytical transmission electron microscopy investigations

Si. Si. Y. Y. Al. Al. Sm. Sm. N. N. Ca. O. O. Ca. Lattice Images of As-received and Heat Treated /-SiAlON. A-Received. Heat Treated. Heat Treated. TJ Amorphous. TJ crystalline. TJ crystalline. Analytical transmission electron microscopy investigations

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Analytical transmission electron microscopy investigations

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  1. Si Si Y Y Al Al Sm Sm N N Ca O O Ca Lattice Images of As-received and Heat Treated /-SiAlON A-Received Heat Treated Heat Treated TJ Amorphous TJ crystalline TJ crystalline Analytical transmission electron microscopy investigations on the effect of heat treatment of SiAION ceramics H Yurdakul, S Turan and H Mandal Anadolu University,Dept. of Materials Science & Eng., Iki Eylul Campus, Eskisehir, 26555 TURKEY Purpose of Study Experimental Procedure XRD Results Producing SiAlON ceramics (1)  Triple Junctions/ Secondary Phase or Phases  Explain the composition of triple junctions/secondary phases and /-SiAlON grains by using Jeol 2100 F transmission electron microscope with attached Jeol STEM-HAADF and EDX dedectors ,  Heat treatment process to SiAlON ceramics         Characterisation of as-received and heat treated SiAlON ceramics by using XRD (2) Determine the heat treatment effects on to triple junctions composition by using analytical electron microscope techniques Characterisation of as-received and heat treated SiAlON ceramics by using Jeol 2100F with attached Jeol STEM-HAADF and EDX dedectors Heat-Treated /-SiAlON ceramics As-Received /-SiAlON ceramics STEM-HAADF Images and EDX Analysis Results of As-Received /-SiAlON STEM-HAADF Images and EDX Analysis Results of Heat-Treated/-SiAlON Triple Junction -SiAlON Secondary Phase Secondary Phase α-SiAlON Composition Y-Sm-Ca-Si-Al-O-N Composition Y-Si-Al-O-N Composition Y-Si-Al-O-N Composition Si-Al-O-N Composition Y--Si-Al-O-N Polytype Composition Si-Al-O-N α-SiAlON -SiAlON -SiAlON Secondary Phase Triple Junction Collapse of Triple Junctions Composition Y-Ca-Si-Al-O-N Composition Y-Sm-Ca-Si-Al-O-N Composition Y-Si-Al-O-N Composition Y-Sm-Ca-Si-Al-O-N Composition Si-Al-O-N Composition Si-Al-O-N EDX Elemental Line Scan Analysis Results of As-Received /-SiAlON EDX Elemental Line Scan Analysis Results of Heat Treated /-SiAlON Results Present preliminary research of as-recevied and heat treated /-SiAlON ceramics were performed by using EDX analysis with STEM-HAADF images and XRD techniques. According to these first results; it was seen that secondary phases couldn’t be dedected their elemental constituents by XRD were present both as-recevied and heat treated /-SiAlON ceramics in such as Y-Si-Al-O-N. Triple junctions compositions of both samples were shown in such as Y-Sm-Ca-Si-Al-O-N and ıttrium was incorparated to -SiAlON structure. But actually EFTEM 3-window elemental mapping, EFTEM-SI (spectum imaging), STEM-SI and PEELS (parallel electron energy loss spectrometer studies sould be performed in future works. If you would like to take more information, please get in contact to sturan@anadolu.edu.tr

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