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Europe SEMI Photovoltaic Committee Liaison Report. Updated October 18, 2011. Committee Leadership. Co-Chairs Laszlo Fabry – Wacker Chemie Hubert Aulich – PV Crystalox Solar. EU Photovoltaic Committee C: Laszlo Fabry – Wacker Chemie C: Hubert Aulich – PV Crystalox Solar.
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Europe SEMI Photovoltaic Committee Liaison Report Updated October 18, 2011
Committee Leadership • Co-Chairs • Laszlo Fabry – Wacker Chemie • Hubert Aulich – PV Crystalox Solar
EU Photovoltaic Committee C: Laszlo Fabry – Wacker Chemie C: Hubert Aulich – PV Crystalox Solar PV Silicon Materials TF P. Wagner Int’ PV Analytical Test Method TF R. Hockett – Evans Analytical PV Ribbon TF C. Prischmann – Ulbrich
Meeting Information • Last meeting • Oct 10-11, 2011 • DAS Facility, Dresden, Germany • Next meeting • March 27-28, 2012 • PV Fab Managers Forum • Berlin, Germany • Check www.semi.org/standards for latest update
Ballot Results Summary from Oct 11 meeting • Doc. 5226, Line Items Revision to PV17-0611, Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications • Approved and will be submitted for Audits and Reviews
Ballots for cycle 1-2012 • Doc. 5331, New Standard: Test Method for In-Line Measurement of Saw Marks on Pv Silicon Wafers by a Light Sectioning Technique • Doc. 5332, New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications • Doc. 5334, Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon • Doc. 5335, Revision of SEMI PV19-0811, Guide for Testing Photovoltaic Connector Ribbon Characteristics
PV Silicon Materials TF (1) Leader: Peter Wagner Document 4805B, Specification For Virgin Silicon Feedstock Materials For Photovoltaic Applications Published as PV17-0611. Charter of TF was recently modified by adding: Develop new standardized test methods for PV Si Materials 8
PV Silicon Materials TF (2) • New SNARFs: • Doc. 5330 New Standard: Test Method for In-Line Measurement of Micro Cracks of PV Silicon Wafers by Infrared Imaging • Doc. 5333 New Standard: Test Method for In-Line Measurement of Waviness on PV Silicon Wafers by a Light Sectioning Technique • Ballots to be submitted in cycle 1-2012 • Doc. 5331 New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique • Doc. 5332 New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications
PV Ribbon TF • Leader - Christian Prischmann/Ulbrich • Current Activities: • Doc. 4800A, New Standard: Guide for Specifying a Photovoltaic Connector Ribbon • Published as PV18-0811 • Doc. 4801, New Standard: Guide for Testing Photovoltaic Connector Ribbon Characteristics • Published as PV19-0811 • Future work includes making minor revision to PV18 and PV19, and writing Ribbon Specification
Crystalline Technology and Manufacturing (CTM) Group • European group of eight crystalline solar cell manufacturers (Q-Cells, Deutsche Cell, Bosch Solar Energy, Schott Solar, Sovello, Sunways, SolarWatt and Solland) is working together within SEMI in a pre-competitive environment to address the technology challenges facing the photovoltaic industry, and recognizes the need for standards. • The priority of the CTM Group will be the definition of the development processes for raw materials, cell technology and cell manufacturing. • The CTM Group has established a crystalline solar cell technology roadmap up to the year 2020 • www.itrpv.net
Questions? • Contact • James Amano (jamano@semi.org) • Kevin Nguyen (knguyen@semi.org) • New SEMI Europe Staff • Yan Guillou , SEMI Europe yguillou@semi.org