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SCC20 Liaison Report

SCC20 Liaison Report. Dr. John W. Sheppard May 8. 2008. Scope.

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SCC20 Liaison Report

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  1. SCC20 Liaison Report Dr. John W. Sheppard May 8. 2008

  2. Scope • “Provides for the management, development, and maintenance of language and interface standards supporting system-level (onboard and offboard) automatic test and diagnosis. These standards include (but are not limited to) test requirements, test programs, test procedures, diagnostic knowledge, maintenance information, and major hardware subsystem interfaces between and within Automatic Test Systems.”

  3. Sponsors/Liaisons • IEEE Sponsors and Liaisons: • Aerospace Electronic Systems Society (Joseph Stanco) • Computer Society (John Sheppard) • Instrumentation and Measurement Society (Mark Kaufman) • Official Industry Liaisons: • US Department of Defense (William Ross) • UK Ministry of Defense (Malcolm Brown) • National Defense Industrial Association (Les Orlidge) • Systems Engineering Committee • Automatic Test Committee • IEC/TC93—Design Automation (Narayanan Ramachandran)

  4. Organization • Administration • Chair: Mike Seavey (Northrop Grumman) • Vice Chair: John Sheppard (Johns Hopkins University) • Steering Committee (general oversight and approval) • Administrative Subcommittee (quality control and procedures review) • Working Groups • Diagnostic and Maintenance Control • Hardware Interfaces • Test and ATS Description • Test Information Infrastructure • Membership • 2008 Annual Report to SASB • 107 members • 32 interested parties (non-member)

  5. Status • Active Standards • IEEE Std 716-1995: ATLAS, reaffirmed 2006. • IEEE Std 1232-2002: Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE), dual logo’ed as IEC 62243 Ed 1.0. • IEEE Std 1445-1998: Digital Test Interchange Format (DTIF), reaffirmed 2004. • IEEE Std 1505-2006: Receiver Fixture Interface (co-sponsored by I&M). • IEEE Std 1522-2004: Testability and Diagnosability Characteristics and Metrics, to be withdrawn. • IEEE Std 1546-2000: DTIF Users Guide, reaffirmed 2006. • IEEE Std 1636.1-2007: Software Interface for Maintenance Information Collection and Analysis (SIMICA), Test Results. • IEEE Std 1641-2004: Signal and Test Definition, under consideration for IEC dual logo. • IEEE Std 1641.1-2006: STD User’s Guide. • IEEE Std 1671-2006: Automatic Test Markup Language. • IEEE Std 1671.3-2007: Automatic Test Markup Language, Unit Under Test Description. • IEEE Std 1671.4-2007: Automatic Test Markup Language, Test Configuration Information.

  6. Status • Projects Underway • P1232: Revision to AI-ESTATE, to be balloted Q4 2008. • P1505: Receiver Fixture Interface, being revised. • P1505.1: Common Test Interface Pin Map, in ballot resolution. • P1505.2: Two-Tier Common Test Interface Pin Map, in development • P1636: Software Interface for Maintenance Information Collection and Analysis (SIMICA), in ballot. • P1636.2 SIMICA Maintenance Action Information, to be balloted Q3 2008. • P1641a: Amendment to STD, PAR to be withdrawn • P1641: STD, new revision to commence, PAR on NESCOM agenda. • P1671.1: ATML Test Description, in ballot. • P1671.2: ATML Instrument Description, ballot completed. • P1671.5: ATML Test Adapter Information, in ballot. • P1671.6: ATML Station Configuration Information, ballot completed.

  7. Recent and Current Issues • Standards Demonstrations: • Standards development being supported by US DoD and UK MoD. • US DoD initiatives based on “Automatic Test System Framework” where 20+ interfaces have been defined. • Developed standards to be registered and mandated via the DoD Information Technology Standards Registry (DISR). • Prior to mandate, all new standards must be “demonstrated.” • Currently, the ATML, SIMICA, and AI-ESTATE standards are undergoing the demonstration process.

  8. Recent and Current Issues • Ad Hoc Committee on SCCs • Created by Roberto DeMarca. John Walz and Robby Robson are members. • Examining multiple issues, one of which sole vs. joint sponsorship of SCCs. • Since SCC20 is jointly sponsored, it became an SCC of interest to this group. • A questionnaire has been distributed. • What is the ideal scenario for Technical Society's participation in SCC? • What would be the best value proposition from the Technical Society to an SCC? • What can and should the Technical Society bring to the table? • Can you map each of your working groups to one or more Technical Society Technical Committees? • Possible role of Technical Society in the SCC governance and on facilitating it's projects. • SCC20 plans to respond shortly. The SCC20 liaison has already provided input.

  9. Next Meeting • Next SCC20 Meeting: • September 2008 in Salt Lake City, Utah • Held in conjunction with IEEE AUTOTESTCON 2008

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