'Charge sharing' diaporamas de présentation

3D sensors Sherwood Parker (U. of Hawaii) Collaborators: High Energy Physics Projects

3D sensors Sherwood Parker (U. of Hawaii) Collaborators: High Energy Physics Projects C. Kenney * (Molecular Biology Consortium) C. Da Via, J. Hasi *, A. Kok, S. Watts (Brunel University ) S. Seidel, M. Hoeferkamp, I. Gorelov (University of New Mexico)

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Collection Of Plots for A Testbeam Paper

Collection Of Plots for A Testbeam Paper. List of Possible Plots. R/Phi resolution, charge sharing, noise etc. Noise performance and few Landau distributions Testpulse MP/Irradiation fluence vs position MP/Irradiation fluence vs position for different bias voltages

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The first beam test of a monolithic particle pixel detector in high-voltage CMOS technology

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2009 SPS Pion beam tests of 3D TimePix Detectors

2009 SPS Pion beam tests of 3D TimePix Detectors. C. Parkes on behalf of Glasgow & CNM. Pion testbeam was conducted by LHCb/Medipix groups, led by Richard Plackett. See backup slide for full list of participants. Outline. Introduction 3D double sided detectors substrates Timepix description

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Lecture 6 Logic gates : Power and Other Logic Family

Lecture 6 Logic gates : Power and Other Logic Family. Pradondet Nilagupta pom@ku.ac.th Department of Computer Engineering Kasetsart University. Acknowledgement.

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Lecture 16: Circuit Pitfalls

Lecture 16: Circuit Pitfalls. Outline. Variation Noise Budgets Reliability Circuit Pitfalls. Variation. Process Threshold Channel length Interconnect dimensions Environment Voltage Temperature Aging / Wearout. Process Variation. Threshold Voltage

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Introduction to CMOS VLSI Design Lecture 9: Circuit Families

Introduction to CMOS VLSI Design Lecture 9: Circuit Families. David Harris Harvey Mudd College Spring 2004. Outline. Pseudo-nMOS Logic Dynamic Logic Pass Transistor Logic. Introduction. What makes a circuit fast? I = C dV/dt -> t pd ? (C/I) D V low capacitance high current

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Introduction to CMOS VLSI Design Circuit Families

Introduction to CMOS VLSI Design Circuit Families. Outline. Pseudo-nMOS Logic Dynamic Logic Pass Transistor Logic. Introduction. What makes a circuit fast? I = C dV/dt -> t pd ? (C/I) D V low capacitance high current small swing Logical effort is proportional to C/I

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Fig . 13.3 Definitions of propagation delays and switching times of the logic inverter.

Fig . 13 . 2 Typical voltage transfer characteristic (VTC) of a logic inverter, illustrating the definition of the critical points. Fig . 13.3 Definitions of propagation delays and switching times of the logic inverter.

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TPC for LC

RD51. TPC for LC. P. Colas. Lanzhou U., Saclay, Tsinghua U. T ime P rojection C hamber. t. electrons diffuse and drift due to the E-field. Ionizing Particle. electrons are separated from ions. E. B. A magnetic field reduces electron diffusion. y. x.

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A full Monte Carlo simulation code for silicon strip detectors

9th Topical Seminar on Innovative Particle and Radiation Detectors May 23-26, 2004- Siena, Italy. A full Monte Carlo simulation code for silicon strip detectors. M. Brigida, C. Favuzzi, P. Fusco, F. Gargano, N. Giglietto, F. Giordano, F. Loparco ,

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Semiconductor detectors

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SEE Scaling Effects

SEE Scaling Effects. Lloyd Massengill 10 May 2005. Hierarchical Multi-Scale Analysis of Radiation Effects. Materials. Device Structure. IC Design. Energy Deposition. Defect Models. Circuit Response. Device Simulation. Scaling and SEUs.

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Wide Range SET Pulse Measurement

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Analysis on TB0904 Data

Analysis on TB0904 Data. Jianchun Wang Syracuse University. The Telescope. VELO. Scint. Pixel. Pixel. Pixel. Y. 120 GeV proton beam. Z. X. YX. Y. YX. RR( F). Pixel & VELO use independent DAQ systems, sharing trigger signals from the same source.

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CMOS DYNAMIC LOGIC DESIGN

CMOS DYNAMIC LOGIC DESIGN. Integrated Circuits Spring 2001 Dept. of ECE University of Seoul. Dynamic Logic Motivation. ? Complementary CMOS Logic ? ? V OH =V DD , V OL =GND ? ? No Static Power Dissipation ? ? For Fan-In of N, (2N) Transistors Required

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Measurements in magnetic field - digression

Measurements in magnetic field - digression. Lorentz angle measurements ATLAS measurements CMS measurements Radiation damage Carries transport properties for high electric field Nonlinear model (or ATLAS model) Consequences Mobility diffusion constant Hall factor Charge collection

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Static Logic vs. Pseudo-nMOS

Static Logic vs. Pseudo-nMOS. Static Logic includes pull-up and pull-down networks - 2n transistors for n-input function. Pseudo-nMOS - n+1 transistors for n-input function Requires pull-up transistor be weaker than pull-down network (5:1)

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Simulation results on p-stop atoll depth/conc and p-stop common unirradiated

Simulation results on p-stop atoll depth/conc and p-stop common unirradiated. Simulations of different doping depths and conc. for the p-stop atoll configuration. ps. electrode #1. electrode #2. p-stop atoll configuration decided to go with 2 strips due to large simulation matrix

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