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Contrel Company Profile

Contrel Company Profile

Contrel Company Profile. Feb , 2007. 歷史沿革 Company History. 企業精神及經營理念 Mission & Commitment. 核心技術 Core Technology. 人力分佈 Human Resource Distribution. 工廠規模 Factory Scale. 機台介紹 Product List. 銷售狀況 Marketing Status. 營業據點 Contact Location. Overview. Headquarters.

By aradia
(168 views)

Governor’s School for the Sciences

Governor’s School for the Sciences

Governor’s School for the Sciences. Mathematics. Day 12. MOTD: Pierre Fermat. 1601 to 1665 (France) Lawyer and Judge Worked in number theory Most famous for ‘Fermat’s Last Theorem’: x n + y n = z n only has integer solutions for n=2

By hasad
(97 views)

Universally Testable AND-EXOR Networks

Universally Testable AND-EXOR Networks

Universally Testable AND-EXOR Networks. Ugur Kalay, Marek Perkowski, Douglas Hall. Speaker: Alan Mishchenko. Portland State University. Agenda. Introduction desired properties of a test set testing AND and EXOR gates test scheme proposed by Reddy Testing Two-level AND-EXOR Networks

By velma
(86 views)

VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 26, 2013, 2:30-3:30PM. Contents.

By cindy
(197 views)

SoC Test Strategies

SoC Test Strategies

SoC Test Strategies. 陳亮宙 R91943049 林學世 R91943073 王偉民 R91943085 92.06.10. Basic Concepts (1/2). __number of detect faults__. ‧Fault Coverage =. number of total faults. ‧Single Stuck-at Fault.

By deanne
(124 views)

ATLAS Local Trigger Processor

ATLAS Local Trigger Processor

ATLAS Local Trigger Processor. P. Borrego Amaral a , N. Ellis a , P. Farthouat a , P. Gallno a , H. Pessoa Lima Junior b , T. Maeno a , I. Resurreccion Arcas a , J. M. de Seixas a , G. Schuler a , R. Spiwoks a , R. Torga Teixeira a , T. Wengler a a CERN b University Rio de Janeiro.

By stella
(107 views)

VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

By sven
(501 views)

4 . Built-In Self Test (BIST): Periodical Off-Line Test on the Field

4 . Built-In Self Test (BIST): Periodical Off-Line Test on the Field

Reference. Unit Under Test. Data Generator. Data Compressor. Comparator. Display. BIST Controller. Start/Stop. Ready. Electronic System. 4 . Built-In Self Test (BIST): Periodical Off-Line Test on the Field. 4 .1 General Structure.

By tambre
(203 views)

3. Built-In Self Test (BIST): Periodical Off-Line Test on the Field

3. Built-In Self Test (BIST): Periodical Off-Line Test on the Field

Reference. Unit Under Test. Data Generator. Data Compressor. Comparator. Display. BIST Controller. Start/Stop. Ready. Electronic System. 3. Built-In Self Test (BIST): Periodical Off-Line Test on the Field. 3.1 General Structure.

By jadon
(150 views)

ELEN 468 Advanced Logic Design

ELEN 468 Advanced Logic Design

ELEN 468 Advanced Logic Design. Lecture 25 Built-in Self Test. BIST ( Built-in Self Test ). PRPG: Pseudo Random Pattern Generator ORA: Output Response Analyzer CUT: Circuit Under Test. PRPG. Start. CUT. PI. PO. ORA. Pass/fail. BIST Motivation.

By alaqua
(160 views)

Design for Testability Theory and Practice Lecture 11: BIST

Design for Testability Theory and Practice Lecture 11: BIST

Design for Testability Theory and Practice Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

By galena
(182 views)

Bait your Hook A Novel Detection Technique for Keyloggers

Bait your Hook A Novel Detection Technique for Keyloggers

Bait your Hook A Novel Detection Technique for Keyloggers. Stefano Ortolani, Cristiano Giurida, and Bruno Crispo RAID 2010 Sep. OUTLINE. Introduction Our Approach Architecture Evaluation Conclusion. Introduction – threat?. Malware with keylogging functionalities.

By apria
(101 views)

FPGA Solutions ...

FPGA Solutions ...

FPGA Solutions. FPGA and LabVIEW Pattern Generator Multi-Channel-Scaler. F ield P rogrammable G ate A rray perform logic operations in hardware behavior defined by "Programmable Interconnects" no CPU (that is executing commands) no "software" no operating system real "hardware"

By van
(171 views)

Homework #5 A bit error rate tester (BERT)

Homework #5 A bit error rate tester (BERT)

Homework #5 A bit error rate tester (BERT). Chris Allen (callen@eecs.ku.edu) Course website URL people.eecs.ku.edu/~callen/713/EECS713.htm. A bit error rate tester (BERT).

By honorato-graham
(123 views)

RTSX-S and RTSX-SU Reliability Test Vehicles

RTSX-S and RTSX-SU Reliability Test Vehicles

RTSX-S and RTSX-SU Reliability Test Vehicles. Daniel K. Elftmann Director Product Engineering Richard Katz Head Grunt Office of Logic Design Igor Kleyner Deputy Grunt Office of Logic Design September 8 th , 2004. Background. Background

By alameda-garza
(142 views)

VLSI ASIC Logic-analyzer Interface Design

VLSI ASIC Logic-analyzer Interface Design

VLSI ASIC Logic-analyzer Interface Design. Push buttons. LED. Project Proposal. sexy.

By clare-davis
(89 views)

Testing Analog & Digital Products Lecture 11: BIST

Testing Analog & Digital Products Lecture 11: BIST

Testing Analog & Digital Products Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

By dicksonc
(0 views)

Introduction to Video on FPGA

Introduction to Video on FPGA

Introduction to Video on FPGA. Aaron Arenas. Agenda. Video Displays Video Generators Video Interfaces VGA Lab Specific's Lab Overview. Video Generator. Video Display. Video Interface. Video Displays. How do displays display? Technologies CRT Plasma LCD Color

By carrollb
(0 views)

VLSI Testing  Lecture 11: BIST

VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

By peterf
(0 views)

Ultimate 3D e-beam lithography for nano/micro-structuring with NanoMaker

Ultimate 3D e-beam lithography for nano/micro-structuring with NanoMaker

Ultimate 3D e-beam lithography for nano/micro-structuring with NanoMaker. INTERFACE Ltd, Moscow IMT RAS, Chernogolovka, Moscow Region. rev. 2015. Preview.

By ednawhite
(0 views)

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