'Pattern generator' diaporamas de présentation

Introduction to Video on FPGA

Introduction to Video on FPGA. Aaron Arenas. Agenda. Video Displays Video Generators Video Interfaces VGA Lab Specific's Lab Overview. Video Generator. Video Display. Video Interface. Video Displays. How do displays display? Technologies CRT Plasma LCD Color

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Universally Testable AND-EXOR Networks

Universally Testable AND-EXOR Networks. Ugur Kalay, Marek Perkowski, Douglas Hall. Speaker: Alan Mishchenko. Portland State University. Agenda. Introduction desired properties of a test set testing AND and EXOR gates test scheme proposed by Reddy Testing Two-level AND-EXOR Networks

457 views • 36 slides

Ultimate 3D e-beam lithography for nano/micro-structuring with NanoMaker

Ultimate 3D e-beam lithography for nano/micro-structuring with NanoMaker. INTERFACE Ltd, Moscow IMT RAS, Chernogolovka, Moscow Region. rev. 2015. Preview.

352 views • 33 slides

VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

907 views • 28 slides

Design for Testability Theory and Practice Lecture 11: BIST

Design for Testability Theory and Practice Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

464 views • 28 slides

Testing Analog & Digital Products Lecture 11: BIST

Testing Analog & Digital Products Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

295 views • 28 slides

VLSI Testing Lecture 11: BIST

VLSI Testing Lecture 11: BIST. Definition of BIST Pattern generator LFSR Response analyzer MISR Aliasing probability BIST architectures Test per scan Test per clock Circular self-test Memory BIST Summary. Define Built-In Self-Test.

374 views • 28 slides

VLSI Testing Lecture 14: Built-In Self-Test

VLSI Testing Lecture 14: Built-In Self-Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, Aug 26, 2013, 2:30-3:30PM. Contents.

484 views • 26 slides

RTSX-S and RTSX-SU Reliability Test Vehicles

RTSX-S and RTSX-SU Reliability Test Vehicles. Daniel K. Elftmann Director Product Engineering Richard Katz Head Grunt Office of Logic Design Igor Kleyner Deputy Grunt Office of Logic Design September 8 th , 2004. Background. Background

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Bait your Hook A Novel Detection Technique for Keyloggers

360 views • 24 slides

ELEN 468 Advanced Logic Design

ELEN 468 Advanced Logic Design. Lecture 25 Built-in Self Test. BIST ( Built-in Self Test ). PRPG: Pseudo Random Pattern Generator ORA: Output Response Analyzer CUT: Circuit Under Test. PRPG. Start. CUT. PI. PO. ORA. Pass/fail. BIST Motivation.

400 views • 23 slides

SoC Test Strategies

SoC Test Strategies. ??? R91943049 ??? R91943073 ??? R91943085 92.06.10. Basic Concepts (1/2). __number of detect faults__. ?Fault Coverage =. number of total faults. ?Single Stuck-at Fault.

375 views • 22 slides

ATLAS Local Trigger Processor

ATLAS Local Trigger Processor. P. Borrego Amaral a , N. Ellis a , P. Farthouat a , P. Gallno a , H. Pessoa Lima Junior b , T. Maeno a , I. Resurreccion Arcas a , J. M. de Seixas a , G. Schuler a , R. Spiwoks a , R. Torga Teixeira a , T. Wengler a a CERN b University Rio de Janeiro.

338 views • 22 slides

Contrel Company Profile

Contrel Company Profile. Feb , 2007. ???? Company History. ????????? Mission & Commitment. ???? Core Technology. ???? Human Resource Distribution. ???? Factory Scale. ???? Product List. ???? Marketing Status. ???? Contact Location. Overview. Headquarters.

412 views • 21 slides

4 . Built-In Self Test (BIST): Periodical Off-Line Test on the Field

Reference. Unit Under Test. Data Generator. Data Compressor. Comparator. Display. BIST Controller. Start/Stop. Ready. Electronic System. 4 . Built-In Self Test (BIST): Periodical Off-Line Test on the Field. 4 .1 General Structure.

507 views • 19 slides

3. Built-In Self Test (BIST): Periodical Off-Line Test on the Field

Reference. Unit Under Test. Data Generator. Data Compressor. Comparator. Display. BIST Controller. Start/Stop. Ready. Electronic System. 3. Built-In Self Test (BIST): Periodical Off-Line Test on the Field. 3.1 General Structure.

348 views • 19 slides

235 views • 13 slides

FPGA Solutions ...

FPGA Solutions. FPGA and LabVIEW Pattern Generator Multi-Channel-Scaler. F ield P rogrammable G ate A rray perform logic operations in hardware behavior defined by "Programmable Interconnects" no CPU (that is executing commands) no "software" no operating system real "hardware"

308 views • 10 slides

Homework #5 A bit error rate tester (BERT)

Homework #5 A bit error rate tester (BERT). Chris Allen (callen@eecs.ku.edu) Course website URL people.eecs.ku.edu/~callen/713/EECS713.htm. A bit error rate tester (BERT).

200 views • 3 slides

VLSI ASIC Logic-analyzer Interface Design

VLSI ASIC Logic-analyzer Interface Design. Push buttons. LED. Project Proposal. sexy.

99 views • 1 slides