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This paper outlines the FNAL test beam team’s evaluation of various detector modules under specific operating conditions. Key devices include reference RF modules and n-in-n and n-in-p RR modules. The performance assessment covers electronic metrics such as noise from pedestal and random runs, gain with test pulses, and header analysis. We analyze charge collection efficiency, signal-to-noise ratio, cluster sizes, and resolution based on angle and irradiation levels. This study aims to address gain non-uniformity and cross-talk, with comparisons against simulation data to enhance test accuracy.
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Fnal Test Beam Paper Outline The FNAL test beam team
Outline • The devices under test (reference rf module, n-in-n, n-in-p RR modules) • Operating conditions (test beam environment, pixel telescope, temperature…) • Electronic performance [noise from pedestal runs and random runs, gain with test pulses and header] • Landau, signal to noise, cluster size, resolution for rf module as a function of angle (check Landaus for highest angle) • Charge collection efficiency, signal to noise, cluster size, resolution and tracking efficiency for n-in-n and n-in-p • Average fractions of hits for high/low irradiation in n-in-p and n-in-n for good pixel tracks.
Outline continued • Charge collection efficiency as a function of HV (normal incidence only) for reference module and irradiated module [ballistic deficit]. • Remarks: • It would be good that the cluster width reflected charge sharing and not noise [3s inclusion threshold?] • Gain non uniformity needs to be taken out especially for p-type sensor • Comparison with simulation?
Cross talk? • From Karol tp studies of cross talk in beam region with Lars settings