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Comparative Analysis of Quality Factor in PMMA-Coated Toroidal Devices Under Varying Conditions

This study involves a detailed comparison of the calculated quality factor (Q) with experimental measurements for PMMA-coated toroidal devices. Conducted by H-S. Choi, the experiments assessed the effects of varying wavelengths (850nm, 980nm) and film thicknesses (0-100nm) while maintaining consistent input power. The findings highlighted a consistent decrease in Q factor with increasing film thickness for both wavelengths. Additionally, the research noted that experimental Q values approached theoretical predictions but were affected by factors such as surface roughness. Future work will include further testing and exploration of PS materials.

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Comparative Analysis of Quality Factor in PMMA-Coated Toroidal Devices Under Varying Conditions

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  1. Objectives • Compare calculated Q with experimental Q for PMMA coated toroidal devices. In these experiments, I varied the: • Wavelength (850nm, 980nm) • Film thickness (0-100nm) • I kept the input power very low, toroid geometry consistent H-S. Choi, 10/2009

  2. Objective 1: 850nm measurements Increasing film thickness 0 nm 20nm 50nm Decreasing Q factor H-S. Choi, 10/2009

  3. Objective 2: 980nm measurements Increasing film thickness 0 nm 20nm 50nm 100nm Decreasing Q factor H-S. Choi, 10/2009

  4. Objective 3: Comparison of theory and experiment Q theory The experimental Q always seems to be nearly same amount below the theory Q – maybe surface roughness? Q theory H-S. Choi, 10/2009

  5. Next Month • Finish testing PMMA (100nm at 850nm) • Maybe try retesting to reach theory Q? • Look at PS as well, using same experimental parameters (film thickness, wavelength, toroid size, input power) H-S. Choi, 10/2009

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