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ELECTRON ENERGY LOSS SPECTROSCOPY

ELECTRON ENERGY LOSS SPECTROSCOPY. GÖZDE ARIBAL 20823751 AYKUT BİLİR 20823842 BORGA DERBENT 20823966.

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ELECTRON ENERGY LOSS SPECTROSCOPY

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  1. ELECTRON ENERGY LOSS SPECTROSCOPY GÖZDE ARIBAL 20823751 AYKUT BİLİR 20823842 BORGA DERBENT 20823966

  2. CONTENTS Whatis the EELS ? The process of historical development How does it work ? Components and properties Why is it used ? Advantages and Disadvantages Compare with EDX Applications Summary References

  3. WHAT IS EELS ? Analyticaltechnique Quantitativeanalysis Analysisof the inelastic scattering suffered by the transmitted electron beam with measurement of the electron energy distribution Capableof giving structural and chemical information Electronspectrometer

  4. Figure 1 High-resolution electron energy loss spectroscopy (EELS) is a high-sensitivity, non-destructive technique for the study of surface and adsorbate vibrations and low-energy electronic excitations.

  5. THE PROCESS OF HISTORICAL DEVELOPMNET James Hillier RF Baker in the mid 1940s Research1990s due to advance in microscope instrumentations and vacuum technology

  6. HOW DOES IT WORK ? Can be obtainedexperimentally Inelasticscattering of X-ray photonsoropticalmeasurements Change in momentum anddirection of propaganation Change in internaldegrees of freedom

  7. A typical EELS spectrum from an thin film Figure2

  8. COMPONENTS AND PROPERTIES Magneticfieldis betweentwoparallelplates. Objectiveaperture Specimen Lens Collectoraperture

  9. Figure 3 Photograph of thefirstelectronmicroanalyzer (Hillerand Baker 1944)

  10. WHY IS IT USED ? Themeasurements of Localproperties Includingspecimenthickness Mechanicalandelectronical Chemicalcomposition

  11. ADVANTAGES Highercore-losssignal Higherultimatespatialresolution Absolute, standardlessquantification Structuralinformationavailable

  12. DISADVANTAGES Higherspectral background Verythinspecimenneeded Possibleinaccuracy in crystals Moreoperatorintensive

  13. COMPARE WITH EDX Table 1.Comprasion between EELS and EDX.

  14. Table 2. X-ray fluorescenceyieldfor K-,L- and M- shells as a function of atomicnumber, fromKrause (1979)

  15. APPLICATIONS Thicknessmeasurements Pressuremeasurements Analyticalelectronmicroscopy(AEM)

  16. SUMMARY Electron energy-loss spectroscopy (EELS) is an analytical technique that measures the change in kinetic energy of electrons after they have interacted with a specimen.

  17. REFERENCES Journal de Physique IV , Colloque C7 , supplémentaujournal de physique III ,Volume 3 R.F. EGERTON ElectronEnergyLossSpectroscopyin TheElectronMicroscope 3. Edition Yüksek Lisans Tezi NANO ÖLÇEKLİ VANANYUM OKSİT İNCE FİLMLERİN YAPISAL VE ELEKTRİKSEL KARAKTERİZASYONU Ogeday ÇAPAR

  18. THANK YOU !

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